Publication Beamlines Strategic Pillar
Das, Sambhu Charan; Chen, Kuan‐Hung; Lin, Wei‐Xuan; Wang, Hsiao‐Tsu; Lee, Cheng‐En et al. (2026). Intrinsic Ferromagnetism and Surface Oxidation in Nb 2 FeC: Revealed by Synchrotron‐Based X‐Ray Spectro‐ and Microscopy. Advanced Electronic Materials . 10.1002/aelm.70534. SM Materials
Das, Sambhu Charan; Chen, Kuan-Hung; Lin, Wei-Xuan; Wang, Hsiao-Tsu; Teng, Shu-Ang et al. (2026). Interfacial Robustness in Fe 2 TiO 5 /ZnO Core–Shell Nanodendrites Revealed by STXM-Ptychography for Enhanced Photoelectrochemical Performance. ACS Applied Materials and Interfaces 18(22) , 32011-32023. 10.1021/acsami.6c03568. SM Materials
Daunt, Stephen J.; Grzywacz, Robert; Western, Colin M.; Lafferty, Walter J.; Flaud, Jean-Marie et al. (2020). First high-resolution infrared spectra of 2–13C-propane: Analyses of the ν26 (B2) c-type and ν9 (A1) b-type bands. Journal of Molecular Structure 1209, 127851. 10.1016/j.molstruc.2020.127851. FAR-IR Materials
David James Morris (2025). Local Structure of Nanoalloys: From Bimetallic to High-Entropy Alloy Nanoparticles. Supervisor: Zhang, Peng. Nova Scotia, Canada: Dalhousie University. . CLS-APS Materials
Davidson, Kirstin M (2026). Lead Astray: Monte Carlo to Determine a Correction Factor for Chlorine Signals in μXRF Maps of Percutaneous Lead Absorption. Supervisor: McNeill, Fiona. Ontario, Canada: McMaster University. https://hdl.handle.net/11375/33588. BIOXAS-IMAGING Materials
Dawkins, Jeremy I. G.; Ghavidel, Mohammadreza Z.; Chhin, Danny; Beaulieu, Isabelle; Hossain, Md Sazzad et al. (2020). Operando Tracking of Solution-Phase Concentration Profiles in Li-Ion Battery Positive Electrodes Using X-ray Fluorescence. Analytical Chemistry 92(16) . 10.1021/acs.analchem.0c02086. VESPERS Materials
Dawkins, Jeremy I. G.; Pan, Yani; Ghavidel, Mohammadreza Z.; Geissler, Johann; Krueger, Bastian et al. (2023). Exploring the Synergistic Effects of Dual‐Layer Electrodes for High Power Li‐Ion Batteries. ChemElectroChem 10(21) . 10.1002/celc.202300279. VESPERS Materials
Day, R. P.; Na, M. X.; Zingl, M.; Zwartsenberg, B.; Michiardi, M. et al. (2022). Three-dimensional electronic structure of LiFeAs. Physical Review B 105(15) . 10.1103/physrevb.105.155142. QMSC Materials
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
de Boer, Tristan; Boyko, Teak D.; Braun, Cordula; Schnick, Wolfgang; Moewes, Alexander et al. (2022). Bandgap and electronic structure of CaSiN 2 : Experiment and theory. International Journal of Applied Ceramic Technology . 10.1111/ijac.14137. SGM Materials
de Boer, Tristan; Fattah, Md. Fahim Al; Amin, Muhammad Ruhul; Ambach, Sebastian J.; Vogel, Sebastian et al. (2022). Band gap and electronic structure of defects in the ternary nitride BP3N6: experiment and theory. Journal of Materials Chemistry C 10(16) , 6429-6434. 10.1039/d1tc06009k. VLS-PGM Materials
de Boer, Tristan; Häusler, Jonas; Strobel, Philipp; Boyko, Teak D.; Rudel, Stefan S. et al. (2021). Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2. Journal of Physical Chemistry C 125(51) . 10.1021/acs.jpcc.1c08115. REIXS, VLS-PGM Materials
de Boer, Tristan; Häusler, Jonas; Strobel, Philipp; Boyko, Teak D.; Rudel, Stefan S. et al. (2021). Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2. Journal of Physical Chemistry C 125(51) . 10.1021/acs.jpcc.1c08115. REIXS, VLS-PGM Materials
de Boer, Tristan LC (2020). Advancing the Characterization of Semiconductors with Synchrotron Radiation. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/13232. REIXS, SGM, VLS-PGM Materials
de Boer, Tristan LC (2020). Advancing the Characterization of Semiconductors with Synchrotron Radiation. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/13232. REIXS, SGM, VLS-PGM Materials