Publication Beamlines Strategic Pillar
Clement Lee (2026). Incorporating Near-Infrared Emitting Persistent Luminescent Nanoparticles within Drug Carriers. Supervisor: Liu Lijia. London (Ontario, Canada): The University of Western Ontario. https://hdl.handle.net/20.500.14721/40127. VLS-PGM Materials
Penacchio, Rafaela F. S (2026). Kinematical and Dynamical X-ray diffraction studies of complex materials. Supervisor: Morelhao, Sergio. Sao Paulo, Brazil: University of Sao Paulo. https://teses.usp.br/teses/disponiveis/43/43134/tde-18082026-185338/pt-br.html. BXDS-IVU, BXDS-WLE Materials
Davidson, Kirstin M (2026). Lead Astray: Monte Carlo to Determine a Correction Factor for Chlorine Signals in μXRF Maps of Percutaneous Lead Absorption. Supervisor: McNeill, Fiona. Ontario, Canada: McMaster University. https://hdl.handle.net/11375/33588. BIOXAS-IMAGING Materials
Hermanson, Noah R F (2026). Modeling Microchannel Mass Transport of Dilute Species and Development of Fabrication Instrumentation and Processes for Inert Electrochemical Microfluidic Devices for ATR-FTIR Spectroscopy. Supervisor: Achenbach, Sven. Saskatchewan, Canada: University of Saskatchewan. https://hdl.handle.net/10388/19038. SYLMAND Materials
Naeem, Sidrah (2026). Chemical information in spectroptychography: Combining absorption and phase. Supervisor: Urquhart, Stephen; Regier, Tom. Saskatchewan, Canada: University of Saskatchewan. https://hdl.handle.net/10388/19193. SM Materials
Zanyk, Noah (2026). Development and Characterization of a Fabrication Process for X-Ray Lithography Masks Based on a Silicon Nitride Membrane. Supervisor: Achenbach, Sven. Saskatchewan, Canada: University of Saskatchewan. https://hdl.handle.net/10388/19217. SYLMAND Materials
Bhandari, Govinda; Cifligu, Petrika; Malik, Trimaan; Pravica, Michael (2026). Hard X-ray-Induced Oxygen Intercalation in WO 3 under High Pressure. Journal of Physical Chemistry C . 10.1021/acs.jpcc.6c02061. BXDS-WHE Materials
Das, Sambhu Charan; Chen, Kuan‐Hung; Lin, Wei‐Xuan; Wang, Hsiao‐Tsu; Lee, Cheng‐En et al. (2026). Intrinsic Ferromagnetism and Surface Oxidation in Nb 2 FeC: Revealed by Synchrotron‐Based X‐Ray Spectro‐ and Microscopy. Advanced Electronic Materials . 10.1002/aelm.70534. SM Materials
Dutta, Animesh; Omessi, Saar; Feng, Renfei; Zhou, Jigang; Wang, Jian et al. (2026). Exposing the (110) Facet of Single-Crystal LiMn2O4 which Suppresses Surface Reconstruction and Enhances High-Temperature Cycling Stability. Journal of the Electrochemical Society . 10.1149/1945-7111/aead2d. VESPERS Materials
Farrag, Heba H.; Berbigier, Jônatas Faleiro; Edward, Ailsa K.; Seferos, Dwight S. (2026). Near‐Theoretical Redox‐Site Utilization and Fast Zn 2+ Storage in a Polyimide‐CNT Cathode. Small . 10.1002/smll.75112. BXDS-WLE Materials
Foroughi, Farangis; Krapohl, David; Norlin, Börje; Chapman, Dean (2026). MIR2-Toolkit : a Python program for multiple-image radiography analysis with integrated silicon-crystal diffraction modeling tools. Journal of Synchrotron Radiation 33(6) . 10.1107/s1600577526008696. BMIT Materials
Hansen, Hannah M.; Loutsch, Nathan R.; Nguyen, Thien H.; Christianson, Aaron; Schuely, Jacob J. et al. (2026). Holistic Assessment of Actinide-Borohydride Covalency Using NMR and X-ray Absorption Spectroscopies. Journal of the American Chemical Society . 10.1021/jacs.6c02674. VLS-PGM Materials
Islam, Taohedul; Bayat, Sahar; Pitton, Kathryn; Wright, Matthew A.; Rahman, Muhammad Mominur et al. (2026). Covalently Integrated Amorphous Mn x Mo 3 S 13 –GO Chalcocarbogel for High Capacity and Long‐Life Sulfur Equivalent Conversion Electrodes. Small . 10.1002/smll.75060. VESPERS Materials
Kaduk, James A. (2026). Interesting hurdles in the solution of pharmaceutical crystal structures using powder diffraction data. Acta Crystallographica Section E Crystallographic Communications 82(10) . 10.1107/s2056989026009382. BXDS-WLE Materials
Kassymova, Meruyert; Singh, Siddhant; Scott, Robert W.J. (2026). Designing AuPd bimetallic C-C coupling catalysts via thermal activation of Au8Pd1(PPh3)8 nanoclusters. Catalysis Today 475, 115832. 10.1016/j.cattod.2026.115832. EIML, HXMA Materials