Publication Beamlines Strategic Pillar
Tolhurst; Thomas (2017). Soft X-ray Spectroscopy of Metal Nitrides and Oxides: Uncovering Structure-property Relationships in Phosphors for pc-LEDs. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/7916. REIXS, SGM Materials
Perera, Sahan D.; Urquhart, Stephen G. (2017). Systematic Investigation of π–π Interactions in Near-Edge X-ray Fine Structure (NEXAFS) Spectroscopy of Paracyclophanes. Journal of Physical Chemistry A 121(26) , 4907-4913. 10.1021/acs.jpca.7b03823. SGM, SM Materials
Leontowich, A F G; Taylor, D M; Wang, J; Regier, C N; Regier, T Z et al. (2017). Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray microscope. Journal of Physics: Conference Series 849, 012045. 10.1088/1742-6596/849/1/012045. SGM, SM Materials
Andrews, Justin L.; De Jesus, Luis R.; Tolhurst, Thomas M.; Marley, Peter M.; Moewes, Alexander et al. (2017). Intercalation-Induced Exfoliation and Thickness-Modulated Electronic Structure of a Layered Ternary Vanadium Oxide. Chemistry of Materials 29(7) , 3285-3294. 10.1021/acs.chemmater.7b00597. CLS-APS, SGM, SM Materials
Tolhurst; Thomas (2017). Soft X-ray Spectroscopy of Metal Nitrides and Oxides: Uncovering Structure-property Relationships in Phosphors for pc-LEDs. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/7916. REIXS, SGM Materials