Publication Beamlines Strategic Pillar
Zhou, J. G.; Fang, H. T.; Maley, J. M.; Murphy, M. W.; Peter Ko, J. Y. et al. (2009). Electronic structure of TiO2 nanotube arrays from X-ray absorption near edge structure studies. Journal of Materials Chemistry 19(37) , 6804. 10.1039/b909225k. SGM, VLS-PGM Materials
Somayaji, Anuradha; Mourhatch, Ramoun; Aswath, Pranesh B. (2007). Nanoscale Mechanical Properties of In-Situ Tribofilms Generated from ZDDP and F-ZDDP with and without Antioxidants. Journal of Nanoscience and Nanotechnology 7(12) , 4378-4390. 10.1166/jnn.2007.905. SGM, VLS-PGM Materials
Henderson, Grant S; Neuville, Daniel R; Cormier, Laurent (2007). An O K-edge XANES study of calcium aluminates. Canadian Journal of Chemistry 85(10) , 801-805. 10.1139/v07-071. SGM Materials
Christensen, Stephen L.; MacDonald, Mark A.; Chatt, Amares; Zhang, Peng; Qian, Huifeng et al. (2012). Dopant Location, Local Structure, and Electronic Properties of Au24Pt(SR)18 Nanoclusters. Journal of Physical Chemistry C 116(51) , 26932-26937. 10.1021/jp310183x. CLS-APS, SGM Materials
Huynh, Lana T.; Eger, Shaylin B.; Walker, James D.S.; Hayes, John R.; Gaultois, Michael W. et al. (2012). How temperature influences the stoichiometry of CeTi2O6. Solid State Sciences 14(6) , 761-767. 10.1016/j.solidstatesciences.2012.03.030. CLS-APS, SGM, SXRMB Materials
Rudyk, Brent W.; Stoyko, Stanislav S.; Oliynyk, Anton O.; Mar, Arthur (2014). Rare-earth transition-metal gallium chalcogenides RE3MGaCh7 (M=Fe, Co, Ni; Ch=S, Se). Journal of Solid State Chemistry 210(1) , 79-88. 10.1016/j.jssc.2013.11.003. SGM Materials
Regier, T.; Krochak, J.; Sham, T.K.; Hu, Y.F.; Thompson, J. et al. (2007). Performance and capabilities of the Canadian Dragon: The SGM beamline at the Canadian Light Source. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 93-95. 10.1016/j.nima.2007.08.071. SGM Materials
Elcock, William (2024). Characterization of Ion Implanted Materials for Photonic Applications: Radiation Damage in Tellurium Dioxide and Silicon LEDs. Supervisor: Chang, Gap Soo. Saskatchewan, Canada: University of Saskatchewan. https://hdl.handle.net/10388/15457. REIXS, VLS-PGM Materials
Sakshi; D. Boyko, Teak; Ramírez, Cristina; Moewes, Alexander (2026). Studying functional groups in graphene oxide with soft X-ray spectroscopy and density functional theory. npj 2D Materials and Applications . 10.1038/s41699-026-00738-6. REIXS Materials
Occhialini, Connor Alexander (2024). Optical and core-level X-ray spectroscopy of correlated two-dimensional materials. Supervisor: Comin, Riccardo. Massachusetts, USA: Massachusetts Institute of Technology. https://hdl.handle.net/1721.1/157567. REIXS Materials
Li, Fengmiao; Aamlid, Solveig; Dicks, Oliver A.; Han, Myung-Geun; Levy, Giorgio et al. (2026). Quantum disorder engineering in superconducting Ti(O,N) thin films. Physical Review B - Condensed Matter and Materials Physics 114(6) . 10.1103/cjgd-fjh2. REIXS Materials
Sakshi; Ufondu, Peter; Boyko, Teak D.; Kubitza, Niels; Birkel, Christina S. et al. (2026). Impact of C/N substitution on the local electronic structure of Cr-MAX phases. Journal of Materiomics , 101281. 10.1016/j.jmat.2026.101281. REIXS Materials
Liu, Yihong (2026). Mn2+-Doped Magnesium Germanate Persistent Luminescence Nanophosphors and Their Potential Applications. Supervisor: Liu, Lijia. Ontario, Canada: University of Western Ontario. https://hdl.handle.net/20.500.14721/39925. HXMA, IDEAS, REIXS, SGM, SXRMB Materials
Chau, Thanh G.; Wolf, Florian; Han, Dan; Saloni; Boyko, Teak D. et al. (2026). Band Gap Tuneability in Antiperovskite‐Based Nitrides AE 3 Pn N and Imides AE 5 Pn 2 (NH) 2 ( AE = Ca, Sr; Pn = As, Sb, Bi). Angewandte Chemie - International Edition . 10.1002/anie.1423389. REIXS Materials
Uchida, Hiroyuki; Mori, Koji; Tomida, Hiroshi; Nakajima, Hiroshi; Noda, Hirofumi et al. (2025). In-orbit performance of the soft X-ray imaging telescope Xtend aboard XRISM. Publications of the Astronomical Society of Japan 77(Supplement_1) , S23-S38. 10.1093/pasj/psaf030. REIXS Materials