Publication Beamlines Strategic Pillar
Bolibruch; N.I.; Vogt; J.M.; Igarashi et al. (2011). Photodiode Calibration using an Electrical Substitution Radiometer in the Hard X-Ray Region. In Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators. Joint Accelerator Conferences Website (JACoW). , 500-502 https://accelconf.web.cern.ch/accelconf/DIPAC2011/papers/tupd83.pdf. BMIT-BM, HXMA Materials
Bolibruch; N.I.; Vogt; J.M.; Igarashi et al. (2011). Photodiode Calibration using an Electrical Substitution Radiometer in the Hard X-Ray Region. In Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators. Joint Accelerator Conferences Website (JACoW). , 500-502 https://accelconf.web.cern.ch/accelconf/DIPAC2011/papers/tupd83.pdf. BMIT-BM, HXMA Materials
Bree; Michael; Miller; Denise; Kerr et al. (2016). Alignment and position visualization methods for the biomedical imaging and therapy (BMIT) MRT lift. In AIP Conference Proceeding. . , 030023-1 – 030023-4 10.1063/1.4952846. BMIT-ID Materials
Challa P; Hinebaugh J; Bazylak AA (2011). Comparison of Water Thickness Profiles of Compressed PEMFC GDLs. In ASME. International Conference on Fuel Cell Science, Engineering and Technology. . , 121-126 10.1115/FuelCell2011-54340. BMIT-BM Materials
Cheng, H. Y.; Chien, W C.; Kuo, I. T.; Yang, C. H.; Chou, Y. C. et al. (2021). Optimizing AsSeGe Chalcogenides by Dopants for Extremely Low IOFF, High Endurance and Low Vth Drift 3D Crosspoint Memory. . 10.1109/iedm19574.2021.9720704. BXDS-WLE Materials
Cheng, H. Y.; Grun, A.; Chien, W C.; Yeh, C. W.; Ray, A. et al. (2022). New Phase-Change Materials by Atomic-Level Engineering the Dopants for Extremely Low Vth Drift at 85 °C and High Endurance 3D Crosspoint Memory : IBM/Macronix PCRAM Joint Project. . 10.1109/iedm45625.2022.10019562. BXDS-WLE Materials
Cheng, H. Y.; Liu, Z. L.; Majumdar, A.; Grun, A.; Ray, A. et al. (2024). State-Independent Low Resistance Drift SiSbTe Phase Change Memory for Analog In-Memory Computing Applications. . , 1-2 10.1109/vlsitechnologyandcir46783.2024.10631376. BXDS-WLE Materials
Chen, Ziyi; Walsh, Andrew; wei, xiao; Zhu, Manzhou; Zhang, Peng et al. (2020). Site-Specific Electronic Properties of [Ag25(SR)18]- Nanoclusters by X-Ray Spectroscopy. Patent Number: 10.26434/chemrxiv.13225199.v1. CLS-APS Materials
Chen, Ziyi; Walsh, Andrew; Wei, Xiao; Zhu, Manzhou; Zhang, Peng et al. (2022). New Insights into the Bonding Properties of [Ag25(SR)18]- Nanoclusters from X-ray Absorption Spectroscopy. Patent Number: 10.26434/chemrxiv-2022-mt480. CLS-APS Materials
Chevalier; S.; Banerjee; R.; Lee et al. (2016). In situ liquid water visualization in polymer electrolyte membrane fuel cells with high resolution synchrotron x-ray radiography. In AIP Conference Proceedings. . , 050006-1 – 050006-4 10.1063/1.4952926. BMIT-BM Materials
Dallin; L.O.; Lowe; D.; Swirsky et al. (2004). Canadian Light Source Magnets. In Proceedings of the 2003 Particle Accelerator Conference. Portland, OR, USA: IEEE. 10.1109/PAC.2003.1289063. Materials
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
Duffy, Alan; Fodje, Michel; Berg, Russ; Grochulski, Pawel (2007). Canadian Macromolecular Crystallography Facility (CMCF) 08ID-1 status update. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 82-83. 10.1016/j.nima.2007.08.066. CMCF-ID Materials
Dydula; Christopher; Belev; George; Johns et al. (2017). Accelerated x-ray scatter projection imaging using multiple continuously moving pencil beams. In Progress in Biomedical Optics and Imaging - Proceedings of SPIE. . , 101324J 10.1117/12.2253720. BMIT-ID Materials
G. A. Melo, Lis; Hitchcock, Adam P; Jankovic, Jasna; Stumper, Jürgen; Susac, Darija et al. (2017). Quantitative Mapping of Ionomer in Catalyst Layers by Electron and X-ray Spectromicroscopy. ECS Transactions 80(8) , 275-282. 10.1149/08008.0275ecst. SM Materials