Publication Beamlines Strategic Pillar
Behyan, S. (2013). Development of Surface Sensitivity in Scanning  X-ray Microscopy and NEXAFS Spectroscopy of Organosulphur Compounds. Supervisor: Urquhart, Stephen G.. Canada, SK: University of Saskatchewan. http://hdl.handle.net/10388/ETD-2013-04-1041. SM, SXRMB Materials
Comin, Riccardo (2013). Charge localization phenomena in correlated oxides. Canada, BC: University of British Columbia. http://hdl.handle.net/2429/45655. REIXS Materials
Muir, D. (2013). A Soft X-Ray Emission Endstation for the Canadian Light Source. Supervisor: Moewes, Alex. Canada, SK: University of Saskatchewan. http://hdl.handle.net/10388/ETD-2013-10-1262. REIXS Materials