Publication Beamlines Strategic Pillar
de Boer, Tristan; Zatsepin, Dmitry; Raikov, Dmitry; Kurmaev, Ernst; Zatsepin, Anatoly F. et al. (2021). Electronic Properties of Carbyne Chains: Experiment and Theory. Journal of Physical Chemistry C 125(15) , 8268-8273. 10.1021/acs.jpcc.0c11323. REIXS, SGM Materials
Dubreuil, R.; Amin, M. R.; Tot, J.; Nagorski, M.; Kadikoff, B. et al. (2022). Structure and bandgap determination of InN grown by RP-MOCVD. Journal of Materials Science: Materials in Electronics 33(22) , 17668-17677. 10.1007/s10854-022-08630-x. REIXS, VLS-PGM Materials
Elzer, Eugenia; Strobel, Philipp; Weiler, Volker; Amin, Muhammad R.; Schmidt, Peter J. et al. (2022). Inverse‐Tunable Red Luminescence and Electronic Properties of Nitridoberylloaluminates Sr 2− x Ba x [BeAl 3 N 5 ]:Eu 2+ ( x =0–2). Chemistry - A European Journal 28(12) . 10.1002/chem.202104121. REIXS Materials
Fattah, Md Fahim Al (2020). SOFT X-RAY SPECTROSCOPY STUDY of WIDE BAND GAP SEMICONDUCTORS-M2PN3 (M=Mg, Zn) and BP3N6. Supervisor: Moewes, Dr. Alexander; Kasap, Dr. Safa. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/12981. REIXS Materials
Freese, Jessica A (2022). Mapping Nanoscale Metal-Insulator Phase Transition in NdNiO3 and Molecular Beam Epitaxy of SmTiO3 Thin Films. Supervisor: Green, Robert. Saskatchewan, Canada: University of Saskatchewan. https://harvest.usask.ca/handle/10388/13849. REIXS, SM Materials
Glazier, Stephen (2015). Investigating Disordered Positive Electrode Materials for Lithium-Ion Batteries Using Li(1+x)Ti2xFe(1-3x)O2. Supervisor: Dahn, Jeff. Nova Scotia, Canada: Dalhousie University. http://hdl.handle.net/10222/60643. CMCF-BM, REIXS, SXRMB Materials
Godin, Simon; Davidson, Bruce A.; Sutarto, Ronny; Liu, Chong; Li, Fengmiao et al. (2022). A method to stabilize the unreconstructed MgO (111) polar surface. Applied Physics Letters 121(6) , 061601. 10.1063/5.0096334. REIXS Materials
Gong, Rantong (2019). Detecting the Surface Spin Polarization State of Topological Materials by Using Resonant X-ray Reflectometry. Supervisor: Hawthorn, David. Waterloo, Canada: University of Waterloo. http://hdl.handle.net/10012/15212. REIXS Materials