Publication Beamlines Strategic Pillar
Gupta, Naman K.; McMahon, Christopher; Sutarto, Ronny; Shi, Tianyu; Gong, Rantong et al. (2021). Vanishing nematic order beyond the pseudogap phase in overdoped cuprate superconductors. Proceedings of the National Academy of Sciences of the United States of America 118(34) , e2106881118. 10.1073/pnas.2106881118. REIXS Materials
Green, R. J.; Zabolotnyy, V.; Zwiebler, M.; Liao, Z.; Macke, S. et al. (2021). Intrinsic versus extrinsic orbital and electronic reconstructions at complex oxide interfaces. Physical Review Materials 5(6) . 10.1103/physrevmaterials.5.065004. REIXS Materials
Green,, R. J.; Sutarto,, R.; He,, F.; Hepting, M.; Hawthorn,, D. G. et al. (2020). Resonant Soft X-ray Reflectometry and Diffraction Studies of Emergent Phenomena in Oxide Heterostructures. Synchrotron Radiation News 33(2) , 20-24. 10.1080/08940886.2020.1725797. REIXS Materials
Gong, Rantong (2019). Detecting the Surface Spin Polarization State of Topological Materials by Using Resonant X-ray Reflectometry. Supervisor: Hawthorn, David. Waterloo, Canada: University of Waterloo. http://hdl.handle.net/10012/15212. REIXS Materials
Godin, Simon; Davidson, Bruce A.; Sutarto, Ronny; Liu, Chong; Li, Fengmiao et al. (2022). A method to stabilize the unreconstructed MgO (111) polar surface. Applied Physics Letters 121(6) , 061601. 10.1063/5.0096334. REIXS Materials
Glazier, Stephen (2015). Investigating Disordered Positive Electrode Materials for Lithium-Ion Batteries Using Li(1+x)Ti2xFe(1-3x)O2. Supervisor: Dahn, Jeff. Nova Scotia, Canada: Dalhousie University. http://hdl.handle.net/10222/60643. CMCF-BM, REIXS, SXRMB Materials
Freese, Jessica A (2022). Mapping Nanoscale Metal-Insulator Phase Transition in NdNiO3 and Molecular Beam Epitaxy of SmTiO3 Thin Films. Supervisor: Green, Robert. Saskatchewan, Canada: University of Saskatchewan. https://harvest.usask.ca/handle/10388/13849. REIXS, SM Materials
Fattah, Md Fahim Al (2020). SOFT X-RAY SPECTROSCOPY STUDY of WIDE BAND GAP SEMICONDUCTORS-M2PN3 (M=Mg, Zn) and BP3N6. Supervisor: Moewes, Dr. Alexander; Kasap, Dr. Safa. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/12981. REIXS Materials
Elzer, Eugenia; Strobel, Philipp; Weiler, Volker; Amin, Muhammad R.; Schmidt, Peter J. et al. (2022). Inverse‐Tunable Red Luminescence and Electronic Properties of Nitridoberylloaluminates Sr 2− x Ba x [BeAl 3 N 5 ]:Eu 2+ ( x =0–2). Chemistry - A European Journal 28(12) . 10.1002/chem.202104121. REIXS Materials
Dubreuil, R.; Amin, M. R.; Tot, J.; Nagorski, M.; Kadikoff, B. et al. (2022). Structure and bandgap determination of InN grown by RP-MOCVD. Journal of Materials Science: Materials in Electronics 33(22) , 17668-17677. 10.1007/s10854-022-08630-x. REIXS, VLS-PGM Materials
de Boer, Tristan; Zatsepin, Dmitry; Raikov, Dmitry; Kurmaev, Ernst; Zatsepin, Anatoly F. et al. (2021). Electronic Properties of Carbyne Chains: Experiment and Theory. Journal of Physical Chemistry C 125(15) , 8268-8273. 10.1021/acs.jpcc.0c11323. REIXS, SGM Materials
de Boer, Tristan LC (2020). Advancing the Characterization of Semiconductors with Synchrotron Radiation. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/13232. REIXS, SGM, VLS-PGM Materials
de Boer, Tristan; Häusler, Jonas; Strobel, Philipp; Boyko, Teak D.; Rudel, Stefan S. et al. (2021). Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2. Journal of Physical Chemistry C 125(51) . 10.1021/acs.jpcc.1c08115. REIXS, VLS-PGM Materials
Comin, Riccardo; Damascelli, Andrea (2016). Resonant X-Ray Scattering Studies of Charge Order in Cuprates. Annual Review of Condensed Matter Physics 7(1) , 369-405. 10.1146/annurev-conmatphys-031115-011401. REIXS Materials
Chen, Zhangsen; Zhang, Gaixia; Hu, Qingmin; Zheng, Yi; Cao, Siyi et al. (2022). The Deep Understanding into the Promoted Carbon Dioxide Electroreduction of ZIF‐8‐Derived Single‐Atom Catalysts by the Simple Grinding Process. Small Structures 3(7) , 2200031. 10.1002/sstr.202200031. HXMA, REIXS, SGM Materials