Publication Beamlines Strategic Pillar
Cao, W.; Masnadi, M.; Eger, S.; Martinson, M.; Xiao, Q.-F. et al. (2013). Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films. Applied Surface Science 265, 358-362. 10.1016/j.apsusc.2012.11.012. SXRMB