Publication Beamlines Strategic Pillar
Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C. et al. (2018). Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells. Microscopy and Microanalysis 24(S2) , 434-435. 10.1017/s1431927618014423. SM Materials
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. SM Materials
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. SM Materials
Wang, Jian (2018). Applications of Soft X-ray Spectromicroscopies to Lithium Ion Battery Analysis. Microscopy and Microanalysis 24(S2) , 416-419. 10.1017/s1431927618014356. SM Materials
G. A. Melo, Lis; Hitchcock, Adam P; Jankovic, Jasna; Stumper, Jürgen; Susac, Darija et al. (2017). Quantitative Mapping of Ionomer in Catalyst Layers by Electron and X-ray Spectromicroscopy. ECS Transactions 80(8) , 275-282. 10.1149/08008.0275ecst. SM Materials
Berejnov, Viatcheslav; Saha, Madhu; Susac, Darija; Stumper, Juergen; West, Marcia et al. (2017). Advances in Structural Characterization Using Soft X-ray Scanning Transmission Microscopy (STXM): Mapping and Measuring Porosity in PEM-FC Catalyst Layers. ECS Transactions 80(8) , 241-252. 10.1149/08008.0241ecst. SM Materials
Leontowich, A F G; Taylor, D M; Wang, J; Regier, C N; Regier, T Z et al. (2017). Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray microscope. Journal of Physics: Conference Series 849, 012045. 10.1088/1742-6596/849/1/012045. SGM, SM Materials
Hitchcock, A. P.; Wu, J.; Lee, V.; Appathurai, N.; Tyliszczak, T. et al. (2016). Progress in Soft X-ray Microscopy Characterization of PEM Fuel Cell Catalyst Layers. Microscopy and Microanalysis 22(S3) , 1290-1291. 10.1017/s1431927616007297. SM Materials
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
Sun, Xiangcheng; Hegde, Manu; Wang, Jian; Zhang, Yuefei; Liao, Jinyun et al. (2014). Structural Analysis and Electrochemical Studies of Carbon Coated Li4Ti5O12 Particles Used as Anode for Lithium-Ion Battery. ECS Transactions 58(14) , 79-88. 10.1149/05814.0079ecst. SM Materials
Deng, Sixu; Wang, Biqiong; Yuan, Yifei; Li, Xia; Sun, Qian et al. (2019). Manipulation of an ionic and electronic conductive interface for highly-stable high-voltage cathodes. Nano Energy 65, 103988. 10.1016/j.nanoen.2019.103988. SGM, SXRMB Materials
Zhang, Bo; Wang, Lie; Cao, Zhen; Kozlov, Sergey M.; García de Arquer, F. Pelayo et al. (2020). High-valence metals improve oxygen evolution reaction performance by modulating 3d metal oxidation cycle energetics. Nature Catalysis 3(12) , 985-992. 10.1038/s41929-020-00525-6. SGM, SXRMB Materials
Adsetts, Jonathan Ralph; Hoesterey, Salena; Love, David A; Ding, Zhifeng (2020). Structural origins of carbon quantum dot luminescence by synchrotron x-ray spectroscopy. Electronic Structure 2(4) , 044004. 10.1088/2516-1075/abd61c. SGM, VLS-PGM Materials
Nie, Yuting; Wang, Zhiqiang; Wang, Jian; Bao, Feng; Zhang, Jinping et al. (2017). Synthesis and Structure-Dependent Optical Properties of ZnO Nanocomb and ZnO Nanoflag. Journal of Physical Chemistry C 121(46) , 26076-26085. 10.1021/acs.jpcc.7b08016. SGM, SM Materials