Publication Beamlines Strategic Pillar
Bernath, Peter F.; Bittner, Dror M.; Sibert III, Edwin L. (2019). Isobutane Infrared Bands: Partial Rotational Assignments, ab Initio Calculations, and Local Mode Analysis. Journal of Physical Chemistry A 123(29) , 6185-6193. 10.1021/acs.jpca.9b03321. FAR-IR Materials
Berkenbrock, Jose-Alvim; Scherer, Torsten; Mail, Matthias; Achenbach, Sven (2020). Numerical Modelling of a Nanopore-based Resistive-Pulse Sensor for Detection of Biomolecules*. . 10.1109/embc44109.2020.9176090. SYLMAND Materials
Berkenbrock, José-Alvim; Machado, Rafaela Grecco; Achenbach, Sven (2018). How Might X-Ray Scanned Potatoes Improve Cancer Treatment?. Microscopy and Microanalysis 24(S2) , 410-411. 10.1017/s1431927618014332. SYLMAND Materials
Berkenbrock, Jose-Alvim; Achenbach, Sven; Wells, Garth; Mail, Matthias; Scherer, Torsten et al. (2020). A polymer-based nano-resistive pulse sensor for detection of biomolecules: fabrication and simulation. . 10.1109/nano47656.2020.9183598. SYLMAND Materials
Bergstrom, John C.; Vogt, Johannes M. (2006). The optical diagnostic beamline at the Canadian Light Source. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 562(1) , 495-512. 10.1016/j.nima.2006.02.200. Materials
Berend Zwartsenberg (2019). Spin-orbit coupling in iridates. Supervisor: Damascelli, Andrea. BC, Canada: University of British Columbia. http://hdl.handle.net/2429/72933. QMSC Materials
Berejnov, Viatcheslav; Saha, Madhu; Susac, Darija; Stumper, Juergen; West, Marcia et al. (2017). Advances in Structural Characterization Using Soft X-ray Scanning Transmission Microscopy (STXM): Mapping and Measuring Porosity in PEM-FC Catalyst Layers. ECS Transactions 80(8) , 241-252. 10.1149/08008.0241ecst. SM Materials
Ben Xu (2015). Assessing different types of disorder in carbonate minerals with vibrational spectroscopy. Supervisor: Poduska, Kristin, M.. Newfoundland and Labrador, Canada: Memorial University. https://research.library.mun.ca/11623/. MID-IR, SXRMB Materials
Bennett, Raymond N.; Hendsbee, Arthur D.; Ngai, Jenner H. L.; Ganguly, Anindya; Li, Yuning et al. (2020). Bisisoindigo–Benzothiadiazole Copolymers: Materials for Ambipolar and n-Channel OTFTs with Low Threshold Voltages. ACS Applied Electronic Materials 2(7) , 2039-2048. 10.1021/acsaelm.0c00305. HXMA Materials
Bellini, Marco; Folliero, Maria G.; Evangelisti, Claudio; He, Qinggang; Hu, Yongfeng et al. (2019). A Gold–Palladium Nanoparticle Alloy Catalyst for CO Production from CO 2 Electroreduction. Energy Technology 7(4) , 1800859. 10.1002/ente.201800859. SXRMB Materials
Belev, G.; Miller, D.; Samadi, N.; Webb, M. A.; Wysokinski, T. W. et al. (2015). 4 Years of X-ray Imaging at 05B1-1 Beamline at BMIT. IFMBE Proceedings , 162-165. 10.1007/978-3-319-19387-8_39. BMIT-BM, BMIT-ID Materials
Belev, George; Wysokinski, Tomasz W.; Chapman, Dean; Mullin, Curtis; McKibben, Mike et al. (2011). Set of measurements for alignment of beamline components. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 649(1) , 225-227. 10.1016/j.nima.2010.11.084. BMIT-BM Materials
Belev, George; Okada, Go; Tonchev, Dancho; Koughia, Cyril; Varoy, Chris et al. (2011). Valency conversion of samarium ions under high dose synchrotron generated X‐ray radiation. Physica Status Solidi (C) Current Topics in Solid State Physics 8(9) , 2822-2825. 10.1002/pssc.201084103. BMIT-BM Materials
Béland, Vanessa A.; Wang, Zhiqiang; Macdonald, Charles L. B.; Sham, Tsun‐Kong; Ragogna, Paul J. et al. (2019). A Comprehensive Investigation of a Zwitterionic Ge I Dimer with a 1,2‐Dicationic Core. Chemistry - A European Journal 25(65) . 10.1002/chem.201903683. CLS-APS, SXRMB Materials
Becher, Johannes; Sanchez, Dario Ferreira; Doronkin, Dmitry E.; Zengel, Deniz; Meira, Debora Motta et al. (2020). Chemical gradients in automotive Cu-SSZ-13 catalysts for NOx removal revealed by operando X-ray spectrotomography. Nature Catalysis 4(1) , 46-53. 10.1038/s41929-020-00552-3. CLS-APS Materials