Publication Beamlines Strategic Pillar
Beauregard, D.; Berg, R.; Black, G.; Dolton, W.; Igarashi, R. et al. (2009). Canadian Light Source - Phase II Beamline Control System Status Update. In Proceedings of ICALEPCS 2009. Joint Accelerator Conferences Website (JACoW). 9784990539108.
Becher, Johannes; Sanchez, Dario Ferreira; Doronkin, Dmitry E.; Zengel, Deniz; Meira, Debora Motta et al. (2020). Chemical gradients in automotive Cu-SSZ-13 catalysts for NOx removal revealed by operando X-ray spectrotomography. Nature Catalysis 4(1) , 46-53. 10.1038/s41929-020-00552-3. CLS-APS Materials
Bechtel, Hans A.; Martin, Michael C.; May, T. E.; Lerch, Philippe (2009). Improved spatial resolution for reflection mode infrared microscopy. Review of Scientific Instruments 80(12) , 126106. 10.1063/1.3270260.
Beenstock, Jonah; Ona, Samara Mishelle; Porat, Jennifer; Orlicky, Stephen; Wan, Leo C. K. et al. (2020). A substrate binding model for the KEOPS tRNA modifying complex. Nature Communications 11(1) . 10.1038/s41467-020-19990-5. [PDB: 7kju] CMCF-ID Health
Behrens, Sebastian; Kappler, Andreas; Obst, Martin (2012). Linking environmental processes to thein situfunctioning of microorganisms by high-resolution secondary ion mass spectrometry (NanoSIMS) and scanning transmission X-ray microscopy (STXM). Environmental Microbiology 14(11) , 2851-2869. 10.1111/j.1462-2920.2012.02724.x. SM
Behyan, S. (2013). Development of Surface Sensitivity in Scanning  X-ray Microscopy and NEXAFS Spectroscopy of Organosulphur Compounds. Canada, SK: University of Saskatchewan. . SM, SXRMB
Behyan, S. (2013). Development of Surface Sensitivity in Scanning  X-ray Microscopy and NEXAFS Spectroscopy of Organosulphur Compounds. Canada, SK: University of Saskatchewan. . SM, SXRMB
Behyan, S.; Haines, B.; Karanukaran, C.; Wang, J.; Obst, M. et al. (2011). Surface Detection in a STXM Microscope. AIP Conference Proceedings , 184-187. 10.1063/1.3625335. SM
Behyan, Shirin; Hu, Yongfeng; Urquhart, Stephen G. (2013). Sulfur 1s near edge x-ray absorption fine structure spectroscopy of thiophenic and aromatic thioether compounds. Journal of Chemical Physics 138(21) , 214302. 10.1063/1.4807604. SXRMB
Behyan, Shirin; Hu, Yongfeng; Urquhart, Stephen G. (2011). Sulfur 1s near-edge x-ray absorption fine structure (NEXAFS) of thiol and thioether compounds. Journal of Chemical Physics 134(24) , 244304. 10.1063/1.3602218. SXRMB
Behyan, Shirin; Hu, Yongfeng; Urquhart, Stephen G. (2014). Chemical sensitivity of sulfur 1s NEXAFS spectroscopy I: Speciation of sulfoxides and sulfones. Chemical Physics Letters 592, 69-74. 10.1016/j.cplett.2013.10.026. SXRMB
Behyan, Shirin; Hu, Yongfeng; Urquhart, Stephen G. (2014). Chemical sensitivity of sulfur 1s NEXAFS spectroscopy II: Speciation of disulfide functional groups. Chemical Physics Letters 592, 109-113. 10.1016/j.cplett.2013.10.027. SXRMB
Béland, Vanessa A.; Wang, Zhiqiang; Macdonald, Charles L. B.; Sham, Tsun‐Kong; Ragogna, Paul J. et al. (2019). A Comprehensive Investigation of a Zwitterionic Ge I Dimer with a 1,2‐Dicationic Core. Chemistry - A European Journal 25(65) . 10.1002/chem.201903683. CLS-APS Materials
Belev, George; Okada, Go; Tonchev, Dancho; Koughia, Cyril; Varoy, Chris et al. (2011). Valency conversion of samarium ions under high dose synchrotron generated X‐ray radiation. Physica Status Solidi (C) Current Topics in Solid State Physics 8(9) , 2822-2825. 10.1002/pssc.201084103. BMIT-BM Materials
Belev, George; Wysokinski, Tomasz W.; Chapman, Dean; Mullin, Curtis; McKibben, Mike et al. (2011). Set of measurements for alignment of beamline components. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 649(1) , 225-227. 10.1016/j.nima.2010.11.084. BMIT-BM Materials