Publication Beamlines Strategic Pillar
Behyan, S.; Haines, B.; Karanukaran, C.; Wang, J.; Obst, M. et al. (2011). Surface Detection in a STXM Microscope. AIP Conference Proceedings , 184-187. 10.1063/1.3625335. SM
Behyan, S. (2013). Development of Surface Sensitivity in Scanning  X-ray Microscopy and NEXAFS Spectroscopy of Organosulphur Compounds. Canada, SK: University of Saskatchewan. . SM, SXRMB
Behrens, Sebastian; Kappler, Andreas; Obst, Martin (2012). Linking environmental processes to thein situfunctioning of microorganisms by high-resolution secondary ion mass spectrometry (NanoSIMS) and scanning transmission X-ray microscopy (STXM). Environmental Microbiology 14(11) , 2851-2869. 10.1111/j.1462-2920.2012.02724.x. SM
BASSIM, N.D.; DE GREGORIO, B.T.; KILCOYNE, A.L.D.; SCOTT, K.; CHOU, T. et al. (2011). Minimizing damage during FIB sample preparation of soft materials. Journal of Microscopy 245(3) , 288-301. 10.1111/j.1365-2818.2011.03570.x. SM
Bassim, ND; DeGregoio, BT; Stroud, RM; Fischione, PE (2008). Study of FIB Damage in Carbonaceous Materials using XANES. Microscopy and Microanalysis 14(S2) , 1008-1009. 10.1017/s1431927608084869. SM
Balestrieri, M.; Gallart, M.; Ziegler, M.; Bazylewski, P.; Ferblantier, G. et al. (2014). Luminescent Properties and Energy Transfer in Pr3+ Doped and Pr3+-Yb3+ Co-doped ZnO Thin Films. Journal of Physical Chemistry C 118(25) , 13775-13780. 10.1021/jp502311z. REIXS, SM