Publication Beamlines Strategic Pillar
Smith, S.; Shu, D.; Bergstrom, J.; Jiang, D. T. (2007). Front End X-Ray Beam Position Monitors at the CLS. AIP Conference Proceedings , 1002-1005. 10.1063/1.2436231. CMCF-ID, HXMA Materials
Duffy, Alan; Fodje, Michel; Berg, Russ; Grochulski, Pawel (2007). Canadian Macromolecular Crystallography Facility (CMCF) 08ID-1 status update. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 82-83. 10.1016/j.nima.2007.08.066. CMCF-ID Materials
Bolibruch; N.I.; Vogt; J.M.; Igarashi et al. (2011). Photodiode Calibration using an Electrical Substitution Radiometer in the Hard X-Ray Region. In Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators. Joint Accelerator Conferences Website (JACoW). , 500-502 https://accelconf.web.cern.ch/accelconf/DIPAC2011/papers/tupd83.pdf. BMIT-BM, HXMA Materials
Smith, S.; Shu, D.; Bergstrom, J.; Jiang, D. T. (2007). Front End X-Ray Beam Position Monitors at the CLS. AIP Conference Proceedings , 1002-1005. 10.1063/1.2436231. CMCF-ID, HXMA Materials
McLeod, J. A. (2018). Correlating Electronic Structure of Metal Oxide Nanomaterials to Device Performance Using Synchrotron-Excited X-Ray Spectroscopy. . 10.1109/asdam.2018.8544465. REIXS Materials
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Leontowich, A F G; Taylor, D M; Wang, J; Regier, C N; Regier, T Z et al. (2017). Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray microscope. Journal of Physics: Conference Series 849, 012045. 10.1088/1742-6596/849/1/012045. SGM, SM Materials
Zhou, X. T.; Heigl, F.; Murphy, M. W.; Regier, T.; Coulthard, I. et al. (2007). Origin of the Luminescence from SnO2 Nanoribbons. AIP Conference Proceedings , 777-779. 10.1063/1.2644661. SGM Materials
Kolmakov, Andrei; Strelcov, Evgheni; Guo, Hongxuan; Yulaev, Alexander; Hoskins, Brian et al. (2018). Graphene windows enable photoelectron microscopies of liquid samples.. Microscopy and Microanalysis 24(S2) , 68-71. 10.1017/s1431927618012746. SM Materials
Melo, Lis G.A.; Hitchcock, Adam P. (2018). Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer.. Microscopy and Microanalysis 24(S2) , 460-461. 10.1017/s1431927618014538. SM Materials
Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C. et al. (2018). Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells. Microscopy and Microanalysis 24(S2) , 434-435. 10.1017/s1431927618014423. SM Materials
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. SM Materials
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. SM Materials
Wang, Jian (2018). Applications of Soft X-ray Spectromicroscopies to Lithium Ion Battery Analysis. Microscopy and Microanalysis 24(S2) , 416-419. 10.1017/s1431927618014356. SM Materials