Publication Beamlines Strategic Pillar
Yatzor, Brett (2012). Chemical Imaging of Coal Speciation within Chinese Outcrop Coals Using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and Scanning Transmission X-Ray Microscopy (STXM). New York, USA: University at Buffalo. http://gradworks.umi.com/35/41/3541318.html. SM
Wells, D.D. (2009). Advanced Instrumental Techniques: (1) Analysis of Spatial Chemical Phase Segregation in Biodegradable Polymers by STXM and TOF-SIMS (2) Novel Effects of Cluster vs. Monatomic Primary Ion Bombardment of Polymers in TOF-SIMS. USA, NY: University at Buffalo. . SM
Wang, Yue (2015). On the formation of electrochemical nanopatterns and their applications. Supervisor: Kruse, Peter. Ontario, Canada: McMaster University. . SM
Schultz, Brian J. (2013). Electronic Structure Imperfections and Chemical Bonding at Graphene Interfaces. New York, USA: University at Buffalo. . SM
Patridge, C.J. (2011). Chemically and Temperature-Induced Phase Transformations of Metal Vanadates. USA, NY: University of Buffalo. . SM