Publication Beamlines Strategic Pillar
Najafi, Ebrahim; Wang, Jian; Hitchcock, Adam P.; Guan, Jingwen; Dénommée, Stephane et al. (2010). Characterization of Single-Walled Carbon Nanotubes by Scanning Transmission X-ray Spectromicroscopy: Purification, Order and Dodecyl Functionalization. Journal of the American Chemical Society 132(26) , 9020-9029. 10.1021/ja101001t. SM
Christensen, S. L.; Haines, B. M.; Lanke, U. D.; Paige, M. F.; Urquhart, S. G. et al. (2011). Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM Journal of Research and Development 55(4) , 5:1-5:6. 10.1147/jrd.2011.2143550. SGM, SM, VLS-PGM
Leontowich, Adam F. G.; Hitchcock, Adam P. (2011). Zone plate focused soft X-ray lithography. Applied Physics A: Materials Science and Processing 103(1) , 1-11. 10.1007/s00339-010-6172-4. SM
Leontowich, Adam F. G.; Hitchcock, Adam P. (2012). Experimental investigation of beam heating in a soft X-ray scanning transmission X-ray microscope. Analyst 137(2) , 370. 10.1039/c1an15688h. SM
Eickhoff, Merle; Obst, Martin; Schröder, Christian; Hitchcock, Adam P.; Tyliszczak, Tolek et al. (2014). Nickel partitioning in biogenic and abiogenic ferrihydrite: The influence of silica and implications for ancient environments. Geochimica et Cosmochimica Acta 140, 65-79. 10.1016/j.gca.2014.05.021. SM
Rossouw, David; Botton, Gianluigi A.; Najafi, Ebrahim; Lee, Vincent; Hitchcock, Adam P. et al. (2012). Metallic and Semiconducting Single-Walled Carbon Nanotubes: Differentiating Individual SWCNTs by Their Carbon 1s Spectra. ACS Nano 6(12) , 121129122645008. 10.1021/nn3045227. SM
Goode, Angela E.; Perkins, James M.; Sandison, Ann; Karunakaran, Chithra; Cheng, Huikai et al. (2012). Chemical speciation of nanoparticles surrounding metal-on-metal hips. Chemical Communications 48(67) , 8335. 10.1039/c2cc33016d. SM
Thompson, Corey M.; Chi, Lisheng; Hayes, John R.; Hallas, Alannah M.; Wilson, Murray N. et al. (2015). Synthesis, structure, and magnetic properties of novel B-site ordered double perovskites, SrLaMReO6 (M = Mg, Mn, Co and Ni). Dalton Transactions 44(23) , 10806-10816. 10.1039/c4dt03821e. CLS-APS, SGM Materials
Khatami, Zahra; Wilson, Patrick Robert James; Wojcik, Jacek; Mascher, Peter (2013). XANES and XES Studies of Luminescent Silicon Carbonitride Thin Films. ECS Transactions 50(41) , 49-56. 10.1149/05041.0049ecst. SGM, VLS-PGM Materials
Wilson, Patrick R.; Khatami, Zahra; Dabkowski, Ryszard; Dunn, Kayne; Chelomentsev, Evgueni et al. (2012). XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films. ECS Transactions 45(5) , 43-48. 10.1149/1.3700408. SGM, VLS-PGM Materials
Reid, Joel; Schmidt, Ken; Warrender, Neil; Bergen, Erika; Cutler, Jeffrey et al. (2016). Multifaceted Solution of Analytical Challenges in Complex Oilfield Materials With Synchrotron Techniques. SPE Journal 22(03) , 875-880. 10.2118/185164-pa. CMCF-BM, SGM Materials
Liang, Caiyun; Gou, Yongjie; Wu, Lina; Zhou, Jigang; Kang, Zhiyu et al. (2016). Nature of Electromagnetic-Transparent SiO2 Shell in Hybrid Nanostructure Enhancing Electromagnetic Attenuation. Journal of Physical Chemistry C 120(24) , 12967-12973. 10.1021/acs.jpcc.6b04721. SGM Materials
Morasch, Robert; Kwabi, David G.; Tulodziecki, Michal; Risch, Marcel; Zhang, Shiyu et al. (2016). Insights into Electrochemical Oxidation of NaO2 in Na–O2 Batteries via Rotating Ring Disk and Spectroscopic Measurements. ACS Applied Materials and Interfaces 9(5) . 10.1021/acsami.6b08355. SGM Materials
Moulton, Benjamin J.A.; Henderson, Grant S.; Fukui, Hiroshi; Hiraoka, Nozomu; de Ligny, Dominique et al. (2016). In situ structural changes of amorphous diopside (CaMgSi2O6) up to 20 GPa: A Raman and O K-edge X-ray Raman spectroscopic study. Geochimica et Cosmochimica Acta 178, 41-61. 10.1016/j.gca.2016.01.020. SGM Materials
Ghodsi, Vahid; Layek, Arunasish; Hegde, Manu; Yildirim, Baran; Radovanovic, Pavle V. et al. (2016). Native defects determine phase-dependent photoluminescence behavior of Eu2+ and Eu3+ in In2O3 nanocrystals. Chemical Communications 52(23) , 4353-4356. 10.1039/c6cc01122e. SGM Materials