Publication Beamlines Strategic Pillar
Gomez, M.A.; Becze, L.; Blyth, R.I.R.; Cutler, J.N.; Demopoulos, G.P. et al. (2010). Molecular and structural investigation of yukonite (synthetic & natural) and its relation to arseniosiderite. Geochimica et Cosmochimica Acta 74(20) , 5835-5851. 10.1016/j.gca.2010.07.023. HXMA, SGM, SM
Goode, Angela E.; Perkins, James M.; Sandison, Ann; Karunakaran, Chithra; Cheng, Huikai et al. (2012). Chemical speciation of nanoparticles surrounding metal-on-metal hips. Chemical Communications 48(67) , 8335. 10.1039/c2cc33016d. SM
Greiner, Mark T.; Festin, Miguel; Kruse, Peter (2008). Investigation of Corrosion-Inhibiting Aniline Oligomer Thin Films on Iron Using Photoelectron Spectroscopy. Journal of Physical Chemistry C 112(48) , 18991-19004. 10.1021/jp805533v. SM, VLS-PGM Materials
Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. SGM, SM
Hanhan, S.; Smith, A.M.; Obst, M.; Hitchcock, A.P. (2009). Optimization of analysis of soft X-ray spectromicroscopy at the Ca 2p edge. Journal of Electron Spectroscopy and Related Phenomena 173(1) , 44-49. 10.1016/j.elspec.2009.04.010. SM
Hegde, Manu; Farvid, Shokouh S.; Hosein, Ian D.; Radovanovic, Pavle V. (2011). Tuning Manganese Dopant Spin Interactions in Single GaN Nanowires at Room Temperature. ACS Nano 5(8) , 6365-6373. 10.1021/nn201482y. SM
Hilhorst, Jan; van Schooneveld, Matti M.; Wang, Jian; de Smit, Emiel; Tyliszczak, Tolek et al. (2012). Three-Dimensional Structure and Defects in Colloidal Photonic Crystals Revealed by Tomographic Scanning Transmission X-ray Microscopy. Langmuir 28(7) , 3614-3620. 10.1021/la204580y. SM
Hitchcock, Adam P.; Berejnov, Viatcheslav; Lee, Vincent; Susac, Darija; Stumper, Juergen et al. (2014). In situ Methods for Analysis of Polymer Electrolyte Membrane Fuel Cell Materials by Soft X-ray Scanning Transmission X-ray Microscopy. Microscopy and Microanalysis 20(S3) , 1532-1533. 10.1017/s1431927614009398. SM
Hitchcock, Adam P.; Berejnov, Viatcheslav; Lee, Vincent; West, Marcia; Colbow, Vesna et al. (2014). Carbon corrosion of proton exchange membrane fuel cell catalyst layers studied by scanning transmission X-ray microscopy. Journal of Power Sources 266, 66-78. 10.1016/j.jpowsour.2014.04.119. SM
Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. SM
Hitchcock, Adam P.; Leung, Bonnie O.; Brash, John L.; Scholl, Andreas; Doran, Andrew et al. (2012). Soft X-ray Spectromicroscopy of Protein Interactions with Phase-Segregated Polymer Surfaces. ACS Symposium Series , 731-760. 10.1021/bk-2012-1120.ch034. SM
Hitchcock, Adam P.; Toney, Michael F. (2014). Spectromicroscopy and coherent diffraction imaging: focus on energy materials applications. Journal of Synchrotron Radiation 21(5) , 1019-1030. 10.1107/s1600577514013046. SM
Hitchcock, AP; Najafi, E; Obst, M; Pireaux, J-J; Douhard, B et al. (2008). Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry. Microscopy and Microanalysis 14(S2) , 190-191. 10.1017/s1431927608082020. SM
Hitchcock, A. P.; Obst, M.; Wang, J.; Lu, Y. S.; Tyliszczak, T. et al. (2012). Advances in the Detection of As in Environmental Samples Using Low Energy X-ray Fluorescence in a Scanning Transmission X-ray Microscope: Arsenic Immobilization by an Fe(II)-Oxidizing Freshwater Bacteria. Environmental Science and Technology 46(5) , 2821-2829. 10.1021/es202238k. SM
Hunter, Ryan C.; Hitchcock, Adam P.; Dynes, James J.; Obst, Martin; Beveridge, Terry J. et al. (2008). Mapping the Speciation of Iron in Pseudomonas aeruginosa Biofilms Using Scanning Transmission X-ray Microscopy. Environmental Science and Technology 42(23) , 8766-8772. 10.1021/es801642z. SM