Publication Beamlines Strategic Pillar
Leontowich, Adam F. G.; Tyliszczak, Tolek; Hitchcock, Adam P. (2011). Measurement of the point spread function of a soft x-ray microscope by single pixel exposure of photoresists. In Damage to VUV, EUV, and X-ray Optics III. SPIE. 9780819486677. SM
Smit, Emiel de; Creemer, J Fredrik; Zandbergen, Henny W; Weckhuysen, Bert M; Groot, Frank M F de et al. (2009). In-situ Scanning Transmission X-ray Microscopy of catalytic materials under reaction conditions. Journal of Physics: Conference Series 190, 012161. 10.1088/1742-6596/190/1/012161. SM
Najafi, Ebrahim; Cruz, Daniel Hernández; Obst, Martin; Hitchcock, Adam P; Felten, Alexandre et al. (2009). Scanning transmission X-ray microscopy of multi-walled carbon nanotubes. Journal of Physics: Conference Series 186, 012106. 10.1088/1742-6596/186/1/012106. SM
Saha, Madhu S; Tam, Mickey; Berejnov, Viatcheslav; Susac, Darija; McDermid, Scott et al. (2013). Characterization and Performance of Catalyst Layers Prepared by Inkjet Printing Technology. ECS Transactions 58(1) , 797-806. 10.1149/05801.0797ecst. SM
Lee, Vincent; Susac, Darija; Kundu, Sumit; Berejnov, Viatcheslav; Atanasoski, Radoslav T et al. (2013). STXM Characterization of Nanostructured Thin Film Anode Before and After Start-Up Shutdown and Reversal Tests. ECS Transactions 58(1) , 473-479. 10.1149/05801.0473ecst. SM
Kaznatcheev, K.; Bertwistle, D.; Cheng, C.; Zohar, S.; Bailey, W. E. et al. (2011). Synchronous (Lock‐in) Measurement Techniques for Magnetic Contrast Enhancement in STXM. AIP Conference Proceedings , 333-336. 10.1063/1.3625372. SM
Behyan, S.; Haines, B.; Karanukaran, C.; Wang, J.; Obst, M. et al. (2011). Surface Detection in a STXM Microscope. AIP Conference Proceedings , 184-187. 10.1063/1.3625335. SM
Khatami, Zahra; Wilson, Patrick Robert James; Wojcik, Jacek; Mascher, Peter (2013). XANES and XES Studies of Luminescent Silicon Carbonitride Thin Films. ECS Transactions 50(41) , 49-56. 10.1149/05041.0049ecst. SGM, VLS-PGM Materials
Wilson, Patrick R.; Khatami, Zahra; Dabkowski, Ryszard; Dunn, Kayne; Chelomentsev, Evgueni et al. (2012). XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films. ECS Transactions 45(5) , 43-48. 10.1149/1.3700408. SGM, VLS-PGM Materials
Elias, Joseph S.; Risch, Marcel; Giordano, Livia; Mansour, Azzam N.; Shao-Horn, Yang et al. (2014). Structure, Bonding, and Catalytic Activity of Monodisperse, Transition-Metal-Substituted CeO2 Nanoparticles. Journal of the American Chemical Society 136(49) , 17193-17200. 10.1021/ja509214d. SGM Materials
Pichaandi, Jothirmayanantham; Das, Gautom Kumar; Johnson, Noah J. J.; Regier, Tom; van Veggel, Frank C. J. M. et al. (2014). Probing the Structure of NaYF4 Nanocrystals using Synchrotron-Based Energy-Dependent X-ray Photoelectron Spectroscopy. Journal of Physical Chemistry C 118(37) , 21639-21646. 10.1021/jp505646j. SGM Materials
Ward, Matthew J; Rupar, Paul A; Murphy, Michael W; Yiu, Yun-Mui; Baines, Kim M et al. (2013). XAFS and XEOL of tetramesityldigermene – An electronic structure study of a heavy group 14 ethylene analogue. Journal of Physics: Conference Series 430, 012046. 10.1088/1742-6596/430/1/012046. CLS-APS, SGM Materials
Ward, M J; Regier, T Z; Vogt, J M; Gordon, R A; Han, W-Q et al. (2013). Time-resolved X-ray excited optical luminescence using an optical streak camera. Journal of Physics: Conference Series 425(9) , 092006. 10.1088/1742-6596/425/9/092006. CLS-APS, SGM Materials
Ward, Matthew James; Han, Wei-Qiang; Sham, Tsun-Kong (2013). Nitridation Temperature Effects on Electronic and Chemical Properties of (Ga1–xZnx)(N1–xOx) Solid Solution Nanocrystals. Journal of Physical Chemistry C 117(39) , 20332-20342. 10.1021/jp406990n. CLS-APS, SGM Materials
Zhou, X. T.; Heigl, F.; Murphy, M. W.; Sham, T. K.; Regier, T. et al. (2006). Time-resolved x-ray excited optical luminescence from SnO2 nanoribbons: Direct evidence for the origin of the blue luminescence and the role of surface states. Applied Physics Letters 89(21) , 213109. 10.1063/1.2387476. SGM Materials