Publication Beamlines Strategic Pillar
Horwat, David; Jullien, Maud; Capon, Fabien; Pierson, Jean-François; Andersson, Joakim et al. (2010). On the deactivation of the dopant and electronic structure in reactively sputtered transparent Al-doped ZnO thin films. Journal of Physics D: Applied Physics 43(13) , 132003. 10.1088/0022-3727/43/13/132003. SGM
Huang, Hui; Sun, Xuhui; Wang, Suidong; Liu, Yang; Li, Xiaorui et al. (2011). Strong red emission of pure Y2O3 nanoparticles from oxygen related defects. Dalton Transactions 40(43) , 11362. 10.1039/c1dt11553g. SGM
Huggins, Frank E.; Galbreath, Kevin C.; Eylands, Kurt E.; Van Loon, Lisa L.; Olson, Jeremy A. et al. (2011). Determination of Nickel Species in Stack Emissions from Eight Residual Oil-Fired Utility Steam-Generating Units. Environmental Science and Technology 45(14) , 6188-6195. 10.1021/es200823a. HXMA
Hunt, Adrian; Dikin, Dmitriy A.; Kurmaev, Ernst Z.; Boyko, Teak D.; Bazylewski, Paul et al. (2012). Epoxide Speciation and Functional Group Distribution in Graphene Oxide Paper-Like Materials. Advanced Functional Materials 22(18) , 3950-3957. 10.1002/adfm.201200529. SGM
Hunter, Ryan C.; Hitchcock, Adam P.; Dynes, James J.; Obst, Martin; Beveridge, Terry J. et al. (2008). Mapping the Speciation of Iron in Pseudomonas aeruginosa Biofilms Using Scanning Transmission X-ray Microscopy. Environmental Science and Technology 42(23) , 8766-8772. 10.1021/es801642z. SM
Hu, Y.F.; Piao, H.; Fronheiser, J.; Matocha, K. (2011). Chemical characterization of SiO2/SiC interface after nitridation treatment. Journal of Electron Spectroscopy and Related Phenomena 184(3-6) , 245-248. 10.1016/j.elspec.2010.09.005. SXRMB
Huynh, Lana T.; Eger, Shaylin B.; Walker, James D.S.; Hayes, John R.; Gaultois, Michael W. et al. (2012). How temperature influences the stoichiometry of CeTi2O6. Solid State Sciences 14(6) , 761-767. 10.1016/j.solidstatesciences.2012.03.030. CLS-APS, SXRMB
Ibrahim, Amr; Predoi-Cross, Adriana; Povey, Chad (2013). Handling techniques for channel spectra in synchrotron-based Fourier transform spectra. Canadian Journal of Physics 91(11) , 910-923. 10.1139/cjp-2013-0050. FAR-IR
Ikeno, Hidekazu; Krause, Michael; Höche, Thomas; Patzig, Christian; Hu, Yongfeng et al. (2013). Variation of Zr-L2,3XANES in tetravalent zirconium oxides. Journal of Physics Condensed Matter 25(16) , 165505. 10.1088/0953-8984/25/16/165505. SXRMB
Isenor, Merrill; Kaminskyj, Susan G. W.; Rodriguez, Russell J.; Redman, Regina S.; Gough, Kathleen M. et al. (2010). Characterization of mannitol in Curvularia protuberata hyphae by FTIR and Raman spectromicroscopy. Analyst 135(12) , 3249. 10.1039/c0an00534g. MID-IR
Ishige, Y.; Sudayama, T.; Wakisaka, Y.; Mizokawa, T.; Wadati, H. et al. (2011). Interplay between Mott physics and Peierls physics in hollandite-type vanadates with a metal-insulator transition. Physical Review B - Condensed Matter and Materials Physics 83(12) . 10.1103/physrevb.83.125112. SGM
Ishii, Masashi; Crowe, Iain F.; Halsall, Matthew P.; Hamilton, Bruce; Hu, Yongfeng et al. (2013). Atomic-scale distortion of optically activated Sm dopants identified with site-selective X-ray absorption spectroscopy. Journal of Applied Physics 114(13) , 133505. 10.1063/1.4824375. SXRMB
Jackson, C. Kira; Koch, Iris; Reimer, Kenneth J. (2013). Mechanisms of dissolved arsenic removal by biochemical reactors: A bench- and field-scale study. Applied Geochemistry 29, 174-181. 10.1016/j.apgeochem.2012.11.012. CLS-APS
Jacquinet-Husson, N.; Crepeau, L.; Armante, R.; Boutammine, C.; Chédin, A. et al. (2011). The 2009 edition of the GEISA spectroscopic database. Journal of Quantitative Spectroscopy and Radiative Transfer 112(15) , 2395-2445. 10.1016/j.jqsrt.2011.06.004. FAR-IR
Jiang, D.T.; Chen, N.; Demopoulos, G.P.; Rowson, J.W. (2010). Response to the comment by D. Paktunc on “Structural characterization of poorly-crystalline scorodite, iron(III)–arsenate co-precipitates and uranium mill neutralized raffinate solids using X-ray absorption fine structure spectroscopy”. Geochimica et Cosmochimica Acta 74(15) , 4597-4602. 10.1016/j.gca.2010.04.014. HXMA