Publication Beamlines Strategic Pillar
Bolibruch; N.I.; Vogt; J.M.; Igarashi et al. (2011). Photodiode Calibration using an Electrical Substitution Radiometer in the Hard X-Ray Region. In Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators. Joint Accelerator Conferences Website (JACoW). , 500-502 https://accelconf.web.cern.ch/accelconf/DIPAC2011/papers/tupd83.pdf. BMIT-BM, HXMA Materials
Boire, S; Zhu, Y; Belev, G; Samadi, N; Szyszkowski, W et al. (2013). A novel beam width doubling double crystal monochromator -some preliminary findings. Journal of Physics: Conference Series 425(5) , 052010. 10.1088/1742-6596/425/5/052010. BMIT-BM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Effects of rare-earth substitution in the oxyarsenides REFeAsO (RE=Ce, Pr, Nd, Sm, Gd) and CeNiAsO by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1477-1483. 10.1016/j.jssc.2010.04.010. VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Bewer, Brian; Chapman, Dean (2010). Development of an x-ray prism for analyzer based imaging systems. Review of Scientific Instruments 81(8) , 085108. 10.1063/1.3478018. BMIT-BM Materials
Bewer, Brian (2011). An electron density measurement using an analyzer based imaging system. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 646(1) , 197-199. 10.1016/j.nima.2011.05.005. BMIT-BM Materials
Betar M. Gallant (2013). Fundamental Understanding and Materials Design Approaches for Lithium-Oxygen Electrochemical Energy Storage. Supervisor: Shao-Horn, Yang. MA, USA: Massachusetts Institute of Technology. http://dspace.mit.edu/handle/1721.1/81698. SGM, VLS-PGM Materials
Betar M. Gallant (2013). Fundamental Understanding and Materials Design Approaches for Lithium-Oxygen Electrochemical Energy Storage. Supervisor: Shao-Horn, Yang. MA, USA: Massachusetts Institute of Technology. http://dspace.mit.edu/handle/1721.1/81698. SGM, VLS-PGM Materials