Publication Beamlines Strategic Pillar
Arthur, Zachary (2013). X-ray Absorption Spectroscopy of Ultrathin Nickel Silicide Films: A Theoretical and Experimental Investigation. Supervisor: Jiang, De-Tong. Ontario, Canada: University of Guelph. http://hdl.handle.net/10214/6380. HXMA Materials
Li, Rong (2013). Electron paramagnetic resonance (EPR) spectroscopic investigation of defect centres in selected borates and borosilicates. Supervisor: Pan, Yuanming. SK, Canada: Univer. http://ecommons.usask.ca/handle/10388/ETD-2012-11-885. HXMA, VESPERS Materials
Smith, S. (2006). Front End X-ray Beam Position Monitors at the Canadian Light Source. Supervisor: Jiang, De-Tong; Bergstrom, Jack C.. Canada, SK: University of Saskatchewan. http://hdl.handle.net/10388/etd-10032006-135432. CMCF, HXMA Materials
Tersigni, Andrew (2012). Structural Characterization of Tetracene Films by Lateral Force Microscopy and Grazing-Incidence X-Ray Diffraction. Supervisor: Qin, Xiaorong. ON, Canada: University of Guelph. http://dspace.lib.uoguelph.ca:8080/xmlui/handle/10214/3496?show=full. CLS-APS, HXMA Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Zhu; Ying (2012). Bent laue crystals in biomedical x-ray imaging application. Supervisor: Chapman, Dean L.; Nichol, Helen. Saskatchewan, Canada: University of Saskatchewan. https://ecommons.usask.ca/handle/10388/ETD-2012-11-768. BMIT-BM, HXMA Materials
Bolibruch; N.I.; Vogt; J.M.; Igarashi et al. (2011). Photodiode Calibration using an Electrical Substitution Radiometer in the Hard X-Ray Region. In Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators. Joint Accelerator Conferences Website (JACoW). , 500-502 https://accelconf.web.cern.ch/accelconf/DIPAC2011/papers/tupd83.pdf. BMIT-BM, HXMA Materials
Smith, S.; Shu, D.; Bergstrom, J.; Jiang, D. T. (2007). Front End X-Ray Beam Position Monitors at the CLS. AIP Conference Proceedings , 1002-1005. 10.1063/1.2436231. CMCF-ID, HXMA Materials
Borvayeh, L.; Ozier, I.; Bauder, A.; Moazzen-Ahmadi, N. (2009). High resolution infrared spectrum and global analysis of ν5, ν12, and ν12+ν6−ν6 in CH3SiH3. Journal of Molecular Spectroscopy 255(2) , 122-133. 10.1016/j.jms.2009.03.008. FAR-IR
Tokaryk, D. W.; van Wijngaarden, J. A. (2009). Fourier transform spectra of the ν16, 2ν16, and 2ν16–ν16 bands of pyrrole taken with synchrotron radiationThis article is part of a Special Issue on Spectroscopy at the University of New Brunswick in honour of Colan Linton and Ron Lees.. Canadian Journal of Physics 87(5) , 443-448. 10.1139/p09-013. FAR-IR
van Wijngaarden, Jennifer; Van Nest, Samantha J.; van Dijk, Cody W.; Tokaryk, Dennis W. (2010). Rovibrational spectrum and analysis of the ν8 band of thiophene using infrared synchrotron radiation. Journal of Molecular Spectroscopy 259(1) , 56-59. 10.1016/j.jms.2009.10.001. FAR-IR
Jacquinet-Husson, N.; Crepeau, L.; Armante, R.; Boutammine, C.; Chédin, A. et al. (2011). The 2009 edition of the GEISA spectroscopic database. Journal of Quantitative Spectroscopy and Radiative Transfer 112(15) , 2395-2445. 10.1016/j.jqsrt.2011.06.004. FAR-IR
Predoi−Cross, Adriana; Herman, Michel; Fusina, Luciano; Di Lonardo, Gianfranco (2012). The far infrared spectrum of trans-formic acid: An extension up to 175cm−1. Journal of Quantitative Spectroscopy and Radiative Transfer 113(11) , 1134-1137. 10.1016/j.jqsrt.2012.01.026. FAR-IR
Kisiel, Zbigniew; Winnewisser, Manfred; Winnewisser, Brenda P.; De Lucia, Frank C.; Tokaryk, Dennis W. et al. (2013). Far-Infrared Spectrum of S(CN)2 Measured with Synchrotron Radiation: Global Analysis of the Available High-Resolution Spectroscopic Data. Journal of Physical Chemistry A 117(50) , 13815-13824. 10.1021/jp408255m. FAR-IR
Lees, Ronald M.; Sun, Zhen-Dong; Billinghurst, B. E. (2011). High-resolution spectroscopy of the C–N stretching band of methylamine. Journal of Chemical Physics 135(10) , 104306. 10.1063/1.3633699. FAR-IR