Publication Beamlines Strategic Pillar
Xiong, Wenhui; Peng, Jian; Hu, Yongfeng (2010). A non-destructive technique to analyze Si content in evaluation of pore blockage of ferrihydrite-modified diatomite using XANES and BET. Microporous and Mesoporous Materials 133(1-3) , 54-58. 10.1016/j.micromeso.2010.04.014. VLS-PGM Materials
Pratt, Allen; Zuin, Lucia; Yiu, Y Mui; Harmer, Sarah (2007). High-resolution XANES S L3,2 edge spectra collected from a series of iron-bearing sphalerite(Zn,Fe)S minerals. Canadian Journal of Chemistry 85(10) , 761-766. 10.1139/v07-072. VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Singh, S.P.; Vogel-Mikus, K.; Pelicon, P.; Vavpetic, P.; Jeromel, L. et al. (2012). New insights into iron transport from maternal tissues to endosperm in mature wheat seed using synchrotron radiation. Quality Assurance and Safety of Crops and Foods 4(3) , 141-141. 10.1111/j.1757-837x.2012.00146.x. VESPERS Materials
Asai, Juhachi; Feng, Renfei (2007). Dose rate estimates due to gas bremsstrahlung for a photon shutter and collimator unit of the VESPERS beamline at the Canadian Light Source. Radiation Measurements 42(10) , 1674-1682. 10.1016/j.radmeas.2007.08.009. VESPERS Materials
Padmos, J. Daniel; Zhang, Peng (2012). Surface Structure of Organosulfur Stabilized Silver Nanoparticles Studied with X-ray Absorption Spectroscopy. Journal of Physical Chemistry C 116(43) , 23094-23101. 10.1021/jp3075332. CLS-APS, HXMA, SXRMB Materials
MacDonald, Mark A.; Zhang, Peng; Qian, Huifeng; Jin, Rongchao (2010). Site-Specific and Size-Dependent Bonding of Compositionally Precise Gold−Thiolate Nanoparticles from X-ray Spectroscopy. Journal of Physical Chemistry Letters 1(12) , 1821-1825. 10.1021/jz100547q. HXMA, SGM, SXRMB, VLS-PGM Materials
Kim, BoHoon; Mourhatch, Ramoun; Aswath, Pranesh B. (2010). Properties of tribofilms formed with ashless dithiophosphate and zinc dialkyl dithiophosphate under extreme pressure conditions. Wear 268(3-4) , 579-591. 10.1016/j.wear.2009.10.004. SGM, SXRMB, VLS-PGM Materials
Christensen, Stephen L.; Chatt, Amares; Zhang, Peng (2012). Biomolecule-Coated Metal Nanoparticles on Titanium. Langmuir 28(5) , 2979-2985. 10.1021/la204398q. CLS-APS, SGM, SXRMB Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Huynh, Lana T.; Eger, Shaylin B.; Walker, James D.S.; Hayes, John R.; Gaultois, Michael W. et al. (2012). How temperature influences the stoichiometry of CeTi2O6. Solid State Sciences 14(6) , 761-767. 10.1016/j.solidstatesciences.2012.03.030. CLS-APS, SGM, SXRMB Materials
Kaznatcheev, K. V.; Dudin, P.; Lavrentovich, O. D.; Hitchcock, A. P. (2007). X-ray microscopy study of chromonic liquid crystal dry film texture. Physical Review E 76(6) . 10.1103/physreve.76.061703. SM Materials
Greiner, Mark T.; Festin, Miguel; Kruse, Peter (2008). Investigation of Corrosion-Inhibiting Aniline Oligomer Thin Films on Iron Using Photoelectron Spectroscopy. Journal of Physical Chemistry C 112(48) , 18991-19004. 10.1021/jp805533v. SM, VLS-PGM Materials
Kaznatcheev, K.V.; Karunakaran, Ch.; Lanke, U.D.; Urquhart, S.G.; Obst, M. et al. (2007). Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 96-99. 10.1016/j.nima.2007.08.083. SM Materials
Kaznacheyev, K.V.; Karunakaran, Ch.; He, F.; Sigrist, M.; Summers, T. et al. (2007). CLS ID-10 chicane configuration: From “Simple Sharing” to extended performance with high-speed polarization switching. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 103-106. 10.1016/j.nima.2007.08.082. REIXS, SM Materials