| Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. |
SGM, SM |
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| Najafi, Ebrahim; Wang, Jian; Hitchcock, Adam P.; Guan, Jingwen; Dénommée, Stephane et al. (2010). Characterization of Single-Walled Carbon Nanotubes by Scanning Transmission X-ray Spectromicroscopy: Purification, Order and Dodecyl Functionalization. Journal of the American Chemical Society 132(26) , 9020-9029. 10.1021/ja101001t. |
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| Christensen, S. L.; Haines, B. M.; Lanke, U. D.; Paige, M. F.; Urquhart, S. G. et al. (2011). Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM Journal of Research and Development 55(4) , 5:1-5:6. 10.1147/jrd.2011.2143550. |
SGM, SM, VLS-PGM |
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| Leontowich, Adam F. G.; Hitchcock, Adam P. (2011). Zone plate focused soft X-ray lithography. Applied Physics A: Materials Science and Processing 103(1) , 1-11. 10.1007/s00339-010-6172-4. |
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| Kuneš, J.; Baldassarre, L.; Schächner, B.; Rabia, K.; Kuntscher, C. A. et al. (2010). Metal-insulator transition inNiS2−xSex. Physical Review B - Condensed Matter and Materials Physics 81(3) . 10.1103/physrevb.81.035122. |
SXRMB |
Peer-Reviewed Article |
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| Lee, Kee Eun; Gomez, Mario A.; Regier, Tom; Hu, Yongfeng; Demopoulos, George P. et al. (2011). Further Understanding of the Electronic Interactions between N719 Sensitizer and Anatase TiO2 Films: A Combined X-ray Absorption and X-ray Photoelectron Spectroscopic Study. Journal of Physical Chemistry C 115(13) , 5692-5707. 10.1021/jp109869z. |
SGM, SXRMB |
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| Demirkiran, Hande; Hu, Yongfeng; Zuin, Lucia; Appathurai, Narayana; Aswath, Pranesh B. et al. (2011). XANES analysis of calcium and sodium phosphates and silicates and hydroxyapatite–Bioglass®45S5 co-sintered bioceramics. Materials Science and Engineering C 31(2) , 134-143. 10.1016/j.msec.2010.08.009. |
SGM, SXRMB, VLS-PGM |
Peer-Reviewed Article |
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| Wang, Ting; Radovanovic, Pavle V. (2010). Free Electron Concentration in Colloidal Indium Tin Oxide Nanocrystals Determined by Their Size and Structure. Journal of Physical Chemistry C 115(2) , 406-413. 10.1021/jp108926a. |
SXRMB |
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| Li, Y.S.; Pan, T.J.; Tang, Y.; Yang, Q.; Hirose, A. et al. (2011). Selective synthesis of diamond and CNT nanostructures directly on stainless steel substrates. Diamond and Related Materials 20(2) , 187-190. 10.1016/j.diamond.2010.11.027. |
SGM, SXRMB, VESPERS |
Peer-Reviewed Article |
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| MacDonald, Mark A.; Zhang, Peng; Chen, Ning; Qian, Huifeng; Jin, Rongchao et al. (2010). Solution-Phase Structure and Bonding of Au38(SR)24 Nanoclusters from X-ray Absorption Spectroscopy. Journal of Physical Chemistry C 115(1) , 65-69. 10.1021/jp1102884. |
HXMA, SXRMB |
Peer-Reviewed Article |
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| Mourhatch, Ramoun; Aswath, Pranesh B. (2011). Tribological behavior and nature of tribofilms generated from fluorinated ZDDP in comparison to ZDDP under extreme pressure conditions—Part II: Morphology and nanoscale properties of tribofilms. Tribology International 44(3) , 201-210. 10.1016/j.triboint.2010.10.035. |
SGM, SXRMB, VLS-PGM |
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| Li, Y.S.; Yang, L.; Tang, Y.; Zhang, C.; Zhang, L. et al. (2011). Adherent nanocrystalline diamond coatings deposited on Ti substrate at moderate temperatures. Surface and Coatings Technology 206(7) , 1971-1976. 10.1016/j.surfcoat.2011.09.077. |
REIXS, SXRMB, VESPERS |
Peer-Reviewed Article |
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| Han, Wei-Qiang; Su, Dong; Murphy, Michael; Ward, Matthew; Sham, Tsun-Kong et al. (2010). Microstructure and electronic behavior of PtPd@Pt core-shell nanowires. Journal of Materials Research 25(4) , 711-717. 10.1557/jmr.2010.0090. |
SXRMB |
Peer-Reviewed Article |
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| Calver, Christina F.; Dash, Priyabrat; Scott, Robert W. J. (2011). Selective Hydrogenations with AgPd Catalysts Prepared by Galvanic Exchange Reactions. ChemCatChem 3(4) , 695-697. 10.1002/cctc.201000346. |
HXMA, SXRMB |
Peer-Reviewed Article |
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| Hu, Y.F.; Piao, H.; Fronheiser, J.; Matocha, K. (2011). Chemical characterization of SiO2/SiC interface after nitridation treatment. Journal of Electron Spectroscopy and Related Phenomena 184(3-6) , 245-248. 10.1016/j.elspec.2010.09.005. |
SXRMB |
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