Publication Beamlines Strategic Pillar
Christensen, S. L.; Haines, B. M.; Lanke, U. D.; Paige, M. F.; Urquhart, S. G. et al. (2011). Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM Journal of Research and Development 55(4) , 5:1-5:6. 10.1147/jrd.2011.2143550. SGM, SM, VLS-PGM
Christensen, Stephen; Lanke, Uday D.; Haines, Brian; Qaqish, Shatha E.; Paige, Matthew F. et al. (2008). Structural and compositional mapping of a phase-separated Langmuir–Blodgett monolayer by X-ray photoelectron emission microscopy. Journal of Electron Spectroscopy and Related Phenomena 162(3) , 107-114. 10.1016/j.elspec.2007.12.003. SM
De GREGORIO, Bradley T.; STROUD, Rhonda M.; CODY, George D.; NITTLER, Larry R.; DAVID KILCOYNE, A. L. et al. (2011). Correlated microanalysis of cometary organic grains returned by Stardust. Meteoritics and Planetary Science 46(9) , 1376-1396. 10.1111/j.1945-5100.2011.01237.x. SM
de Groot, Frank M. F.; de Smit, Emiel; van Schooneveld, Matti M.; Aramburo, Luis R.; Weckhuysen, Bert M. et al. (2010). In-situ Scanning Transmission X-Ray Microscopy of Catalytic Solids and Related Nanomaterials. ChemPhysChem 11(5) , 951-962. 10.1002/cphc.200901023. SM
de Smit, Emiel; Swart, Ingmar; Creemer, J. Fredrik; Karunakaran, Chithra; Bertwistle, Drew et al. (2009). Nanoscale Chemical Imaging of the Reduction Behavior of a Single Catalyst Particle. Angewandte Chemie - International Edition 48(20) , 3632-3636. 10.1002/anie.200806003. SM
Farvid, Shokouh S.; Hegde, Manu; Hosein, Ian D.; Radovanovic, Pavle V. (2011). Electronic structure and magnetism of Mn dopants in GaN nanowires: Ensemble vs single nanowire measurements. Applied Physics Letters 99(22) , 222504. 10.1063/1.3664119. HXMA, SM
Felten, Alexandre; Gillon, Xavier; Gulas, Michal; Pireaux, Jean-Jacques; Ke, Xiaoxing et al. (2010). Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray Microscopy. ACS Nano 4(8) , 4431-4436. 10.1021/nn1002248. SM
Gomez, M.A.; Becze, L.; Blyth, R.I.R.; Cutler, J.N.; Demopoulos, G.P. et al. (2010). Molecular and structural investigation of yukonite (synthetic & natural) and its relation to arseniosiderite. Geochimica et Cosmochimica Acta 74(20) , 5835-5851. 10.1016/j.gca.2010.07.023. HXMA, SGM, SM
Greiner, Mark T.; Festin, Miguel; Kruse, Peter (2008). Investigation of Corrosion-Inhibiting Aniline Oligomer Thin Films on Iron Using Photoelectron Spectroscopy. Journal of Physical Chemistry C 112(48) , 18991-19004. 10.1021/jp805533v. SM, VLS-PGM Materials
Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. SGM, SM
Hanhan, S.; Smith, A.M.; Obst, M.; Hitchcock, A.P. (2009). Optimization of analysis of soft X-ray spectromicroscopy at the Ca 2p edge. Journal of Electron Spectroscopy and Related Phenomena 173(1) , 44-49. 10.1016/j.elspec.2009.04.010. SM
Hegde, Manu; Farvid, Shokouh S.; Hosein, Ian D.; Radovanovic, Pavle V. (2011). Tuning Manganese Dopant Spin Interactions in Single GaN Nanowires at Room Temperature. ACS Nano 5(8) , 6365-6373. 10.1021/nn201482y. SM
Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. SM
Hitchcock, AP; Najafi, E; Obst, M; Pireaux, J-J; Douhard, B et al. (2008). Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry. Microscopy and Microanalysis 14(S2) , 190-191. 10.1017/s1431927608082020. SM
Hunter, Ryan C.; Hitchcock, Adam P.; Dynes, James J.; Obst, Martin; Beveridge, Terry J. et al. (2008). Mapping the Speciation of Iron in Pseudomonas aeruginosa Biofilms Using Scanning Transmission X-ray Microscopy. Environmental Science and Technology 42(23) , 8766-8772. 10.1021/es801642z. SM