Publication Beamlines Strategic Pillar
Gaultois, Michael W.; Grosvenor, Andrew P. (2011). XANES and XPS investigations of (TiO2)x(SiO2)1−x: the contribution of final-state relaxation to shifts in absorption and binding energies. Journal of Materials Chemistry 21(6) , 1829. 10.1039/c0jm03464a. CLS-APS, SGM, VLS-PGM
Lu, Yi-Chun; Kwabi, David G.; Yao, Koffi P. C.; Harding, Jonathon R.; Zhou, Jigang et al. (2011). The discharge rate capability of rechargeable Li–O2 batteries. Energy and Environmental Science 4(8) , 2999. 10.1039/c1ee01500a. SGM, VLS-PGM
Mourhatch, Ramoun; Aswath, Pranesh B. (2011). Tribological behavior and nature of tribofilms generated from fluorinated ZDDP in comparison to ZDDP under extreme pressure conditions—Part II: Morphology and nanoscale properties of tribofilms. Tribology International 44(3) , 201-210. 10.1016/j.triboint.2010.10.035. SGM, SXRMB, VLS-PGM
Rudyk, Brent W.; Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2011). Electronic structure of lanthanum copper oxychalcogenides LaCuOCh (Ch=S, Se, Te) by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 184(7) , 1649-1654. 10.1016/j.jssc.2011.05.005. SGM, VLS-PGM
Wilson, Patrick RJ; Roschuk, Tyler; Dunn, Kayne; Normand, Elise N; Chelomentsev, Evgueni et al. (2011). Effect of thermal treatment on the growth, structure and luminescence of nitride-passivated silicon nanoclusters. Nanoscale Research Letters 6(1) , 168. 10.1186/1556-276x-6-168. SGM, VLS-PGM
Asai, Juhachi; Feng, Renfei (2007). Dose rate estimates due to gas bremsstrahlung for a photon shutter and collimator unit of the VESPERS beamline at the Canadian Light Source. Radiation Measurements 42(10) , 1674-1682. 10.1016/j.radmeas.2007.08.009. VESPERS Materials
Durocher, J.L.; Schindler, M. (2011). Iron-hydroxide, iron-sulfate and hydrous-silica coatings in acid-mine tailings facilities: A comparative study of their trace-element composition. Applied Geochemistry 26(8) , 1337-1352. 10.1016/j.apgeochem.2011.05.007. VESPERS
Lin, J.; Pan, Y.; Chen, N.; Mao, M.; Li, R. et al. (2011). ARSENIC INCORPORATION IN COLEMANITE FROM BORATE DEPOSITS: DATA FROM ICP-MS,  -SXRF, XAFS AND EPR ANALYSES. Canadian Mineralogist 49(3) , 809-822. 10.3749/canmin.49.3.809. HXMA, VESPERS
Li, Y.S.; Pan, T.J.; Tang, Y.; Yang, Q.; Hirose, A. et al. (2011). Selective synthesis of diamond and CNT nanostructures directly on stainless steel substrates. Diamond and Related Materials 20(2) , 187-190. 10.1016/j.diamond.2010.11.027. SGM, SXRMB, VESPERS
Li, Y.S.; Yang, L.; Tang, Y.; Zhang, C.; Zhang, L. et al. (2011). Adherent nanocrystalline diamond coatings deposited on Ti substrate at moderate temperatures. Surface and Coatings Technology 206(7) , 1971-1976. 10.1016/j.surfcoat.2011.09.077. REIXS, SXRMB, VESPERS
Matias, E.; Medrano, D.; Chabot, D.; Maxwell, D.; McIntyre, N. S. et al. (2008). Remote Beamline Access at the CLS. Synchrotron Radiation News 21(5) , 30-33. 10.1080/08940880802406083. VESPERS
McIntyre, N. Stewart; Sherry, Nathaniel; Fuller, Marina Suominen; Feng, Renfei; Kotzer, Thomas et al. (2010). X-Ray fluorescence spectroscopy and mapping using excitation from white and broad bandpass synchrotron radiation. Journal of Analytical Atomic Spectrometry 25(9) , 1381. 10.1039/c004581k. VESPERS
Pan, T.J.; Li, Y.S.; Yang, Q.; Feng, R.F.; Hirose, A. et al. (2011). Internal oxidation and phase transformations of multi-phase Fe–Ni–Al and Fe–Ni–Al–Cr alloys induced by KCl corrosion. Corrosion Science 53(6) , 2115-2121. 10.1016/j.corsci.2011.02.034. VESPERS
Pan, Y.; Mashkovtsev, R. I.; Huang, D.; Mao, M.; Shatskiy, A. et al. (2011). Mechanisms of Cr and H incorporation in stishovite determined by single-crystal EPR spectroscopy and DFT calculations. American Mineralogist 96(8-9) , 1331-1342. 10.2138/am.2011.3762. VESPERS
Achenbach, Sven; Klymyshyn, David; Mappes, Timo; Kachayev, Anton; Subramanian, Venkat et al. (2008). Submicron-scale surface acoustic wave resonators fabricated by high aspect ratio X-ray lithography and aluminum lift-off. Microsystem Technologies 14(9-11) , 1715-1719. 10.1007/s00542-007-0498-7. SYLMAND