Publication Beamlines Strategic Pillar
Kaznatcheev, K.V.; Karunakaran, Ch.; Lanke, U.D.; Urquhart, S.G.; Obst, M. et al. (2007). Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 96-99. 10.1016/j.nima.2007.08.083. SM Materials
Kaznatcheev, K. V.; Dudin, P.; Lavrentovich, O. D.; Hitchcock, A. P. (2007). X-ray microscopy study of chromonic liquid crystal dry film texture. Physical Review E 76(6) . 10.1103/physreve.76.061703. SM Materials
Kaznacheyev, K.V.; Karunakaran, Ch.; He, F.; Sigrist, M.; Summers, T. et al. (2007). CLS ID-10 chicane configuration: From “Simple Sharing” to extended performance with high-speed polarization switching. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 103-106. 10.1016/j.nima.2007.08.082. REIXS, SM Materials
Ju, Ling; Sabergharesou, Tahereh; Stamplecoskie, Kevin G.; Hegde, Manu; Wang, Ting et al. (2011). Interplay between Size, Composition, and Phase Transition of Nanocrystalline Cr3+-Doped BaTiO3 as a Path to Multiferroism in Perovskite-Type Oxides. Journal of the American Chemical Society 134(2) , 1136-1146. 10.1021/ja2091678. SM
Hunter, Ryan C.; Hitchcock, Adam P.; Dynes, James J.; Obst, Martin; Beveridge, Terry J. et al. (2008). Mapping the Speciation of Iron in Pseudomonas aeruginosa Biofilms Using Scanning Transmission X-ray Microscopy. Environmental Science and Technology 42(23) , 8766-8772. 10.1021/es801642z. SM
Hitchcock, AP; Najafi, E; Obst, M; Pireaux, J-J; Douhard, B et al. (2008). Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry. Microscopy and Microanalysis 14(S2) , 190-191. 10.1017/s1431927608082020. SM
Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. SM
Hegde, Manu; Farvid, Shokouh S.; Hosein, Ian D.; Radovanovic, Pavle V. (2011). Tuning Manganese Dopant Spin Interactions in Single GaN Nanowires at Room Temperature. ACS Nano 5(8) , 6365-6373. 10.1021/nn201482y. SM
Hanhan, S.; Smith, A.M.; Obst, M.; Hitchcock, A.P. (2009). Optimization of analysis of soft X-ray spectromicroscopy at the Ca 2p edge. Journal of Electron Spectroscopy and Related Phenomena 173(1) , 44-49. 10.1016/j.elspec.2009.04.010. SM
Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. SGM, SM
Greiner, Mark T.; Festin, Miguel; Kruse, Peter (2008). Investigation of Corrosion-Inhibiting Aniline Oligomer Thin Films on Iron Using Photoelectron Spectroscopy. Journal of Physical Chemistry C 112(48) , 18991-19004. 10.1021/jp805533v. SM, VLS-PGM Materials
Gomez, M.A.; Becze, L.; Blyth, R.I.R.; Cutler, J.N.; Demopoulos, G.P. et al. (2010). Molecular and structural investigation of yukonite (synthetic & natural) and its relation to arseniosiderite. Geochimica et Cosmochimica Acta 74(20) , 5835-5851. 10.1016/j.gca.2010.07.023. HXMA, SGM, SM
Felten, Alexandre; Gillon, Xavier; Gulas, Michal; Pireaux, Jean-Jacques; Ke, Xiaoxing et al. (2010). Measuring Point Defect Density in Individual Carbon Nanotubes Using Polarization-Dependent X-ray Microscopy. ACS Nano 4(8) , 4431-4436. 10.1021/nn1002248. SM
Farvid, Shokouh S.; Hegde, Manu; Hosein, Ian D.; Radovanovic, Pavle V. (2011). Electronic structure and magnetism of Mn dopants in GaN nanowires: Ensemble vs single nanowire measurements. Applied Physics Letters 99(22) , 222504. 10.1063/1.3664119. HXMA, SM
de Smit, Emiel; Swart, Ingmar; Creemer, J. Fredrik; Karunakaran, Chithra; Bertwistle, Drew et al. (2009). Nanoscale Chemical Imaging of the Reduction Behavior of a Single Catalyst Particle. Angewandte Chemie - International Edition 48(20) , 3632-3636. 10.1002/anie.200806003. SM