Publication Beamlines Strategic Pillar
de Smit, Emiel; Swart, Ingmar; Creemer, J. Fredrik; Karunakaran, Chithra; Bertwistle, Drew et al. (2009). Nanoscale Chemical Imaging of the Reduction Behavior of a Single Catalyst Particle. Angewandte Chemie - International Edition 48(20) , 3632-3636. 10.1002/anie.200806003. SM
Obst, Martin; Grathwohl, Peter; Kappler, Andreas; Eibl, Oliver; Peranio, Nicola et al. (2011). Quantitative High-Resolution Mapping of Phenanthrene Sorption to Black Carbon Particles. Environmental Science and Technology 45(17) , 7314-7322. 10.1021/es2009117. SM
Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. SGM, SM
Najafi, Ebrahim; Wang, Jian; Hitchcock, Adam P.; Guan, Jingwen; Dénommée, Stephane et al. (2010). Characterization of Single-Walled Carbon Nanotubes by Scanning Transmission X-ray Spectromicroscopy: Purification, Order and Dodecyl Functionalization. Journal of the American Chemical Society 132(26) , 9020-9029. 10.1021/ja101001t. SM
Christensen, S. L.; Haines, B. M.; Lanke, U. D.; Paige, M. F.; Urquhart, S. G. et al. (2011). Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM. IBM Journal of Research and Development 55(4) , 5:1-5:6. 10.1147/jrd.2011.2143550. SGM, SM, VLS-PGM
Leontowich, Adam F. G.; Hitchcock, Adam P. (2011). Zone plate focused soft X-ray lithography. Applied Physics A: Materials Science and Processing 103(1) , 1-11. 10.1007/s00339-010-6172-4. SM
Mostaghimi Ghomi; Homa (2011). Adiabatic shear localization in AISI 1340 and 4340 steels: The influence of microstructure and geometry. Supervisor: Odeshi, Akindele Gabriel. Saskatoon, Saskatchewan, Canada: University of Saskatchewan. http://ecommons.usask.ca/handle/10388/ETD-2011-09-164. SM Materials
Kaznatcheev, K. V.; Dudin, P.; Lavrentovich, O. D.; Hitchcock, A. P. (2007). X-ray microscopy study of chromonic liquid crystal dry film texture. Physical Review E 76(6) . 10.1103/physreve.76.061703. SM Materials
Greiner, Mark T.; Festin, Miguel; Kruse, Peter (2008). Investigation of Corrosion-Inhibiting Aniline Oligomer Thin Films on Iron Using Photoelectron Spectroscopy. Journal of Physical Chemistry C 112(48) , 18991-19004. 10.1021/jp805533v. SM, VLS-PGM Materials
Kaznatcheev, K.V.; Karunakaran, Ch.; Lanke, U.D.; Urquhart, S.G.; Obst, M. et al. (2007). Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 96-99. 10.1016/j.nima.2007.08.083. SM Materials
Kaznacheyev, K.V.; Karunakaran, Ch.; He, F.; Sigrist, M.; Summers, T. et al. (2007). CLS ID-10 chicane configuration: From “Simple Sharing” to extended performance with high-speed polarization switching. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 103-106. 10.1016/j.nima.2007.08.082. REIXS, SM Materials
Li, J. W.; Matias, E.; Chen, N.; Kim, C.-Y.; Wang, J. et al. (2010). Investigations of mechanical vibrations for beamlines at the Canadian Light Source. Journal of Synchrotron Radiation 18(2) , 109-116. 10.1107/s0909049510041075. CMCF-ID, REIXS, SM Materials
Ko, J Y Peter; Hu, Yongfeng; Armelao, Lidia; Sham, Tsun-Kong (2009). XANES and XEOL studies of Eu-doped calcium tungstate in silica synthesized by sol-gel method. Journal of Physics: Conference Series 190, 012078. 10.1088/1742-6596/190/1/012078. SGM, SXRMB
Yates, Brian; Hu, Yongfeng; Nagarkal, Vinay (2010). Improved synchrotron performance from indium antimonide crystals. Proceedings of SPIE - The International Society for Optical Engineering . 10.1117/12.859706. SXRMB
Hu, Y. F.; Coulthard, I.; Chevrier, D.; Wright, G.; Igarashi, R. et al. (2010). Preliminary Commissioning and Performance of the Soft X-ray Micro-characterization Beamline at the Canadian Light Source. AIP Conference Proceedings , 343-346. 10.1063/1.3463208. SXRMB