Publication Beamlines Strategic Pillar
Borrero-González, L J; Nunes, L A O; Guimarães, F E G; Wojcik, J; Mascher, P et al. (2011). From amorphous to crystalline silicon nanoclusters: structural effects on exciton properties. Journal of Physics Condensed Matter 23(50) , 505302. 10.1088/0953-8984/23/50/505302. SGM
Blanchard, Peter E.R.; Slater, Brianna R.; Cavell, Ronald G.; Mar, Arthur; Grosvenor, Andrew P. et al. (2010). Electronic structure of lanthanum transition-metal oxyarsenides LaMAsO (M= Fe, Co, Ni) and LaFe1−M′ AsO (M′ = Co, Ni) by X-ray photoelectron and absorption spectroscopy. Solid State Sciences 12(1) , 50-58. 10.1016/j.solidstatesciences.2009.10.001. HXMA, SGM
Blanchard, Peter E. R.; Grosvenor, Andrew P.; Cavell, Ronald G.; Mar, Arthur (2008). X-ray Photoelectron and Absorption Spectroscopy of Metal-Rich Phosphides M2P and M3P (M = Cr−Ni). Chemistry of Materials 20(22) , 7081-7088. 10.1021/cm802123a. SGM
Blanchard, Peter E. R.; Grosvenor, Andrew P.; Cavell, Ronald G.; Mar, Arthur (2009). Effects of metal substitution in transition-metal phosphides (Ni1−xM′x)2P (M′ = Cr, Fe, Co) studied by X-ray photoelectron and absorption spectroscopy. Journal of Materials Chemistry 19(33) , 6015. 10.1039/b904250d. HXMA, SGM
Bazylewski, Paul F.; Kim, Kyung Hwan; Forrest, Jay L.; Tada, Hirokazu; Choi, Dong Hoon et al. (2011). Side-chain effects on electronic structure and molecular stacking arrangement of PCBM spin-coated films. Chemical Physics Letters 508(1-3) , 90-94. 10.1016/j.cplett.2011.04.017. SGM
Armelao, Lidia; Heigl, Franziskus; Brunet, Sophie; Sammynaiken, Ramaswami; Regier, Tom et al. (2010). The Origin and Dynamics of Soft X‐Ray‐Excited Optical Luminescence of ZnO. ChemPhysChem 11(17) , 3625-3631. 10.1002/cphc.201000730. SGM, VLS-PGM
Arima, Valentina; Blyth, Robert I. R.; Matino, Francesca; Chiodo, Letizia; Sala, Fabio Della et al. (2008). Zinc Porphyrin-Driven Assembly of Gold Nanofingers. Small 4(4) , 497-506. 10.1002/smll.200700276. SGM
Achkar, A. J.; Regier, T. Z.; Wadati, H.; Kim, Y.-J.; Zhang, H. et al. (2011). Bulk sensitive x-ray absorption spectroscopy free of self-absorption effects. Physical Review B - Condensed Matter and Materials Physics 83(8) . 10.1103/physrevb.83.081106. SGM
Achkar, A. J.; Regier, T. Z.; Monkman, E. J.; Shen, K. M.; Hawthorn, D. G. et al. (2011). Determination of total x-ray absorption coefficient using non-resonant x-ray emission. Scientific Reports 1(1) . 10.1038/srep00182. SGM
Abel, Keith A.; Boyer, John-Christopher; Veggel, Frank C. J. M. van (2009). Hard Proof of the NaYF4/NaGdF4 Nanocrystal Core/Shell Structure. Journal of the American Chemical Society 131(41) , 14644-14645. 10.1021/ja906971y. SGM
Abad, Manuel David; Sanjinés, Rosendo; Endrino, Jose Luis; Gago, Raúl; Andersson, Joakim et al. (2011). Identification of Ternary Phases in TiBC/a-C Nanocomposite Thin Films: Influence on the Electrical and Optical Properties. Plasma Processes and Polymers 8(7) , 579-588. 10.1002/ppap.201000182. SGM, VLS-PGM
Mostaghimi Ghomi; Homa (2011). Adiabatic shear localization in AISI 1340 and 4340 steels: The influence of microstructure and geometry. Supervisor: Odeshi, Akindele Gabriel. Saskatoon, Saskatchewan, Canada: University of Saskatchewan. http://ecommons.usask.ca/handle/10388/ETD-2011-09-164. SM Materials
Li, J. W.; Matias, E.; Chen, N.; Kim, C.-Y.; Wang, J. et al. (2010). Investigations of mechanical vibrations for beamlines at the Canadian Light Source. Journal of Synchrotron Radiation 18(2) , 109-116. 10.1107/s0909049510041075. CMCF-ID, REIXS, SM Materials
Kaznatcheev, K.V.; Karunakaran, Ch.; Lanke, U.D.; Urquhart, S.G.; Obst, M. et al. (2007). Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators. Spectrometers. Detectors and Associated Equipment 582(1) , 96-99. 10.1016/j.nima.2007.08.083. SM Materials
Kaznatcheev, K. V.; Dudin, P.; Lavrentovich, O. D.; Hitchcock, A. P. (2007). X-ray microscopy study of chromonic liquid crystal dry film texture. Physical Review E 76(6) . 10.1103/physreve.76.061703. SM Materials