Publication Beamlines Strategic Pillar
Horwat, David; Jullien, Maud; Capon, Fabien; Pierson, Jean-François; Andersson, Joakim et al. (2010). On the deactivation of the dopant and electronic structure in reactively sputtered transparent Al-doped ZnO thin films. Journal of Physics D: Applied Physics 43(13) , 132003. 10.1088/0022-3727/43/13/132003. SGM
Hitchcock, AP; Najafi, E; Obst, M; Pireaux, J-J; Douhard, B et al. (2008). Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry. Microscopy and Microanalysis 14(S2) , 190-191. 10.1017/s1431927608082020. SM
Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. SM
Hessel, Colin M.; Henderson, Eric J.; Kelly, Joel A.; Cavell, Ronald G.; Sham, Tsun-Kong et al. (2008). Origin of Luminescence from Silicon Nanocrystals: a Near Edge X-ray Absorption Fine Structure (NEXAFS) and X-ray Excited Optical Luminescence (XEOL) Study of Oxide-Embedded and Free-Standing Systems. Journal of Physical Chemistry C 112(37) , 14247-14254. 10.1021/jp802095j. SGM