Publication Beamlines Strategic Pillar
Murphy, Michael; Zhou, Xing-Tai; Heigl, Franziskus; Regier, Tom; Sham, Tsun-Kong et al. (2007). An X-Ray Excited Optical Luminescence (XEOL) Analysis of Mn2+ Doped ZnS Nanostructures. AIP Conference Proceedings , 764-766. 10.1063/1.2644657. SGM
Qin, X. R.; Tersigni, A.; Shi, J.; Jiang, D. T. (2006). Structure and Morphology of Tetracene Thin Films on Hydrogen-Terminated Si(001). Materials Research Society Symposium - Proceedings 965. 10.1557/proc-0965-s12-25. SGM
Regier, T.; Paulsen, J.; Wright, G.; Coulthard, I.; Tan, K. et al. (2007). Commissioning of the Spherical Grating Monochromator Soft X-ray Spectroscopy Beamline at the Canadian Light Source. AIP Conference Proceedings , 473-476. 10.1063/1.2436101. SGM
Roschuk, Tyler; Wilson, Patrick; Li, Jing; Dunn, Kayne; Wojcik, Jacek et al. (2009). Structure and Luminescence of Rare Earth-doped Silicon Oxides Studied Through XANES and XEOL. ECS Transactions 25(9) . 10.1149/1.3211180. SGM, VLS-PGM
Sham; T.K.; Blyth; R.I.R.; Coulthard et al. (2006). Time-resolved X-ray Excited Optical Luminescence Capabilities for Nanostructure Studies at the Canadian Light Source and other Canadian Synchrotron Facilities. In Canada Nanoforum. . . SGM
Sham; T.K.; Coulthard; I.; Zuin et al. (2006). Materials Analysis Using Photon-in, Photon-out Spectroscopy. In Proceedings to 5th International Conference on Synchrotron Radiation in Materials Science, SRMS5. . . SGM, VLS-PGM
Wilson, Patrick R.; Roschuk, Tyler; Dunn, Kayne; Betti, Matthew; Wojcik, Jacek et al. (2009). The Influence of Structural Ordering on Luminescence from Nitride- and Oxynitride-Passivated Silicon Nanoclusters. ECS Transactions 19(8) . 10.1149/1.3116894. SGM, VLS-PGM
Wilson, Patrick R.; Roschuk, Tyler; Zalloum, Othman; Wojcik, Jacek; Mascher, P. et al. (2009). The Effects of Deposition and Processing Parameters on the Electronic Structure and Photoluminescence from Nitride-Passivated Silicon Nanoclusters. ECS Transactions 16(21) . 10.1149/1.3100625. SGM, VLS-PGM
Bassim, ND; DeGregoio, BT; Stroud, RM; Fischione, PE (2008). Study of FIB Damage in Carbonaceous Materials using XANES. Microscopy and Microanalysis 14(S2) , 1008-1009. 10.1017/s1431927608084869. SM
Christensen, Stephen; Lanke, Uday D.; Haines, Brian; Qaqish, Shatha E.; Paige, Matthew F. et al. (2008). Structural and compositional mapping of a phase-separated Langmuir–Blodgett monolayer by X-ray photoelectron emission microscopy. Journal of Electron Spectroscopy and Related Phenomena 162(3) , 107-114. 10.1016/j.elspec.2007.12.003. SM
de Smit, Emiel; Swart, Ingmar; Creemer, J. Fredrik; Karunakaran, Chithra; Bertwistle, Drew et al. (2009). Nanoscale Chemical Imaging of the Reduction Behavior of a Single Catalyst Particle. Angewandte Chemie - International Edition 48(20) , 3632-3636. 10.1002/anie.200806003. SM
Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. SGM, SM
Hanhan, S.; Smith, A.M.; Obst, M.; Hitchcock, A.P. (2009). Optimization of analysis of soft X-ray spectromicroscopy at the Ca 2p edge. Journal of Electron Spectroscopy and Related Phenomena 173(1) , 44-49. 10.1016/j.elspec.2009.04.010. SM
Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. SM
Hitchcock, AP; Najafi, E; Obst, M; Pireaux, J-J; Douhard, B et al. (2008). Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry. Microscopy and Microanalysis 14(S2) , 190-191. 10.1017/s1431927608082020. SM