Publication Beamlines Strategic Pillar
Lam, Simone; Heigl, Franziskus; Kim, P.-S. Grace; Sham, T. K.; Gordon, Robert A. et al. (2007). X-Ray Excited Optical Luminescence from Ru(bipy)[sub 3]2+] and Ru(phen)[sub 3]2+] in the Energy and Time Domains. AIP Conference Proceedings , 687-689. 10.1063/1.2644633. SGM
Murphy, Michael; Zhou, Xing-Tai; Heigl, Franziskus; Regier, Tom; Sham, Tsun-Kong et al. (2007). An X-Ray Excited Optical Luminescence (XEOL) Analysis of Mn2+ Doped ZnS Nanostructures. AIP Conference Proceedings , 764-766. 10.1063/1.2644657. SGM
Qin, X. R.; Tersigni, A.; Shi, J.; Jiang, D. T. (2006). Structure and Morphology of Tetracene Thin Films on Hydrogen-Terminated Si(001). Materials Research Society Symposium - Proceedings 965. 10.1557/proc-0965-s12-25. SGM
Regier, T.; Paulsen, J.; Wright, G.; Coulthard, I.; Tan, K. et al. (2007). Commissioning of the Spherical Grating Monochromator Soft X-ray Spectroscopy Beamline at the Canadian Light Source. AIP Conference Proceedings , 473-476. 10.1063/1.2436101. SGM
Sham; T.K.; Blyth; R.I.R.; Coulthard et al. (2006). Time-resolved X-ray Excited Optical Luminescence Capabilities for Nanostructure Studies at the Canadian Light Source and other Canadian Synchrotron Facilities. In Canada Nanoforum. . . SGM
Sham; T.K.; Coulthard; I.; Zuin et al. (2006). Materials Analysis Using Photon-in, Photon-out Spectroscopy. In Proceedings to 5th International Conference on Synchrotron Radiation in Materials Science, SRMS5. . . SGM, VLS-PGM
Bassim, ND; DeGregoio, BT; Stroud, RM; Fischione, PE (2008). Study of FIB Damage in Carbonaceous Materials using XANES. Microscopy and Microanalysis 14(S2) , 1008-1009. 10.1017/s1431927608084869. SM
Christensen, Stephen; Lanke, Uday D.; Haines, Brian; Qaqish, Shatha E.; Paige, Matthew F. et al. (2008). Structural and compositional mapping of a phase-separated Langmuir–Blodgett monolayer by X-ray photoelectron emission microscopy. Journal of Electron Spectroscopy and Related Phenomena 162(3) , 107-114. 10.1016/j.elspec.2007.12.003. SM
Hale, Penelope; Turgeon, Stéphane; Horny, Paula; Lewis, François; Brack, Narelle et al. (2008). X-ray Photoelectron Emission Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Ultrathin Fluoropolymer Coatings for Stent Applications. Langmuir 24(15) , 7897-7905. 10.1021/la8002788. SGM, SM
Hitchcock, Adam P.; Dynes, James J.; Johansson, Göran; Wang, Jian; Botton, Gianluigi et al. (2008). Comparison of NEXAFS microscopy and TEM-EELS for studies of soft matter. Micron 39(6) , 741-748. 10.1016/j.micron.2007.09.010. SM
Hitchcock, AP; Najafi, E; Obst, M; Pireaux, J-J; Douhard, B et al. (2008). Scanning Transmission X-ray Microscopy of Individual Multi-Walled Carbon Nanotubes: Linear Dichroism and Functionalization Chemistry. Microscopy and Microanalysis 14(S2) , 190-191. 10.1017/s1431927608082020. SM
Hunter, Ryan C.; Hitchcock, Adam P.; Dynes, James J.; Obst, Martin; Beveridge, Terry J. et al. (2008). Mapping the Speciation of Iron in Pseudomonas aeruginosa Biofilms Using Scanning Transmission X-ray Microscopy. Environmental Science and Technology 42(23) , 8766-8772. 10.1021/es801642z. SM
Najafi, Ebrahim; Cruz, Daniel Hernández; Obst, Martin; Hitchcock, Adam P.; Douhard, Bastien et al. (2008). Polarization Dependence of the C 1s X-ray Absorption Spectra of Individual Multi-Walled Carbon Nanotubes. Small 4(12) , 2279-2285. 10.1002/smll.200800439. SM
Urquhart, Stephen G.; Lanke, Uday D.; Fu, Juxia (2008). Characterisation of molecular orientation in organic nanomaterials by X-ray Linear Dichroism Microscopy. International Journal of Nanotechnology 5(9/10/11/12) , 1138. 10.1504/ijnt.2008.019835. SM
Jayas; D.S.; Ghosh; P.K.; Paliwal et al. (2008). Quality Evaluation of Wheat. In Da-Wen Sun(Ed.), Computer Vision Technology for Food Quality Evaluation. Elsevier. 10.1016/b978-012373642-0.50018-1. SM