Publication Beamlines Strategic Pillar
LI, Zexia; Zhang, Mingze; Wang, Lili; LI, Yizhan (2025). A Novel Type Collaboration: Global Big Science Facilities Co-utilization. . 10.51408/issi2025_121.
C. Baribeau, M. Sigrist (2025). Magnetic measurement of a decommissioned insertion device at the Canadian Light Source. IPAC 16, 1843-1846. 10.18429/JACoW-IPAC2025-WEPB048. Materials
S. Saadat, M. Boland, P. Kallakuri (2025). Multimethod signal processing for comprehensive tune coupling characterization at Canadian Light Source. IPAC 16, 2909-2912. 10.18429/JACoW-IPAC2025-THPM106. Materials
Peng, Hongwei; Bai, Penghui; Lu, Yuan; Zhu, Ning; Yang, Chen et al. (2025). The influence of scale inhibitor SAS/AA/AMPS on CO2 corrosion behavior of N80 steel in simulated produced water. Patent Number: 10.2139/ssrn.5472438. Materials
Denis Spasyuk (2025). XASDB - Design and Implementation of an Open-Access Spectral Database. SK, Canada: Canadian Light Source. https://arxiv.org/abs/2509.13566. Materials
William Diamond; Vinay NAGARKAL; Mark de JONG; Christopher REGIER; Linda Lin et al. (2024). APPARATUS FOR PRODUCING MOLYBDENUM-99 (99MO) FROM A PLURALITY OF MOLYBDENUM-100 (100MO) TARGETS BY A PHOTO-NUCLEAR REACTION ON THE 100MO TARGETS. Patent Number: BR112015029336B1. Materials
(2024). Exit Window for Electron Beam in Isotope Production. Patent Number: IL268283B2.
Xueliang Sun; Xiaona Li; Jianwen LIANG; Changhong Wang; Huan Huang et al. (2024). Solid electrolyte material for lithium secondary battery, electrode, and battery. Patent Number: EP4371942A3.
クラーク・アンドリュー・ギャリソン; ウォン・ジェフリー・マイケル; チュー・アイジュン; チャン・ショワン (2025). Material density measurement by computed tomography with diffraction artifact correction.. Patent Number: JP2025522860A.
Jehad ABED; Steven Thorpe; Edward Sargent (2025). Production of nanochalcogenides for use in electrocatalysis. Patent Number: US20250353758A1.
Andrew Garrison Clark; Jeffrey Michael Wong; Aijun Zhu; Shuang Zhang (2024). Method for density measurement of materials using computed tomography with diffraction artifact correction. Patent Number: CA3259909A1.
Andrew Garrison CLARK; Jeffrey Michael WONG; Aijun Zhu; Shuang Zhang (2025). Method for density measurement of materials using computed tomography with diffraction artifact correction. Patent Number: EP4548068A1.
Haotian WANG; Jung Yoon KIM; Peng ZHU (2025). Electrochemical carbon dioxide capture and recovery in a solid electrolyte reactor system. Patent Number: EP4507808A1.
Haotian Wang; Jung Yoon KIM; Peng Zhu (2025). Electrochemical carbon dioxide capture and recovery in a solid electrolyte reactor system. Patent Number: US20250235818A1.
A·G·克拉克; J·M·黄; A·朱; 张爽 (2025). Method for material density measurement using computed tomography with diffraction artifact correction. Patent Number: CN119522360A.