Publication Beamlines Strategic Pillar
Song, Yanpei; Verma, Gaurav; Tan, Kui; Oyekan, Kolade A; Liu, Juejing et al. (2024). Tailoring the Coordination Micro‐Environment in Nanotraps for Efficient Platinum/Palladium Separation. Advanced Materials 36(28) . 10.1002/adma.202313747. Materials
Singhapong, Wadwan; Bowen, Chris; Wang, Hongchang; Sawhney, Kawal; Lunt, Alexander J. G. et al. (2024). Multilayer Optics for Synchrotron Applications. Advanced Materials Technologies 9(18) . 10.1002/admt.202302187. Materials
Boschini, Fabio; Zonno, Marta; Damascelli, Andrea (2024). Time-resolved ARPES studies of quantum materials. Reviews of Modern Physics 96(1) . 10.1103/revmodphys.96.015003. Materials
William Diamond; Vinay NAGARKAL; Mark de JONG; Christopher REGIER; Linda Lin et al. (2024). APPARATUS FOR PRODUCING MOLYBDENUM-99 (99MO) FROM A PLURALITY OF MOLYBDENUM-100 (100MO) TARGETS BY A PHOTO-NUCLEAR REACTION ON THE 100MO TARGETS. Patent Number: BR112015029336B1. Materials
Folgueira Judit Anido; Johan Fransson; Jean Philippe Julien; Swetha Raman; Suarez Joan Seoane et al. (2025). Antibodies against lif and uses thereof. Patent Number: NZ755004B2. Agriculture
(2024). Exit Window for Electron Beam in Isotope Production. Patent Number: IL268283B2.
Xueliang Sun; Xiaona Li; Jianwen LIANG; Changhong Wang; Huan Huang et al. (2024). Solid electrolyte material for lithium secondary battery, electrode, and battery. Patent Number: EP4371942A3.
クラーク・アンドリュー・ギャリソン; ウォン・ジェフリー・マイケル; チュー・アイジュン; チャン・ショワン (2025). Material density measurement by computed tomography with diffraction artifact correction.. Patent Number: JP2025522860A.
Jehad ABED; Steven Thorpe; Edward Sargent (2025). Production of nanochalcogenides for use in electrocatalysis. Patent Number: US20250353758A1.
Andrew Garrison Clark; Jeffrey Michael Wong; Aijun Zhu; Shuang Zhang (2024). Method for density measurement of materials using computed tomography with diffraction artifact correction. Patent Number: CA3259909A1.
Andrew Garrison CLARK; Jeffrey Michael WONG; Aijun Zhu; Shuang Zhang (2025). Method for density measurement of materials using computed tomography with diffraction artifact correction. Patent Number: EP4548068A1.
Haotian WANG; Jung Yoon KIM; Peng ZHU (2025). Electrochemical carbon dioxide capture and recovery in a solid electrolyte reactor system. Patent Number: EP4507808A1.
Haotian Wang; Jung Yoon KIM; Peng Zhu (2025). Electrochemical carbon dioxide capture and recovery in a solid electrolyte reactor system. Patent Number: US20250235818A1.
A·G·克拉克; J·M·黄; A·朱; 张爽 (2025). Method for material density measurement using computed tomography with diffraction artifact correction. Patent Number: CN119522360A.
Jason Chin; Nicolas HUGUENIN-DEZOT; Mohan MAHESH; Duy P. Nguyen; Shan Tang et al. (2025). Methods and Compositions. Patent Number: AU2025205622A1.