Publication Beamlines Strategic Pillar
LI, Zexia; Zhang, Mingze; Wang, Lili; LI, Yizhan (2025). A Novel Type Collaboration: Global Big Science Facilities Co-utilization. . 10.51408/issi2025_121.
Дуглас УЛРИХ (2022). Output window for electron beam in isotope production. Patent Number: RU2762668C9.
Douglas ULLRICH (2022). Exit window for electron beam in isotope production. Patent Number: US11476076B2.
シュエリヤン サン; シャオナ リ; ジャンウェン リャン; チャンゴン ワン; ファン ファン et al. (2023). Lithium secondary battery solid electrolyte materials, electrodes and batteries. Patent Number: JP7390692B2.
Douglas ULLRICH (2026). Converter target holder and exit window for electron beam for isotope production. Patent Number: EP3574720B1.
Douglas ULLRICH (2022). Exit window for electron beam in isotope production. Patent Number: AU2018212953B2.
Xueliang Sun; Xiaona LI; Jianwen LIANG; Changhong Wang; Huan Huang et al. (2022). Solid electrolyte material for lithium secondary battery, electrode, and battery. Patent Number: US20220216507A1.
(2024). Exit Window for Electron Beam in Isotope Production. Patent Number: IL268283B2.
Xueliang Sun; Xiaona Li; Jianwen LIANG; Changhong Wang; Huan Huang et al. (2024). Solid electrolyte material for lithium secondary battery, electrode, and battery. Patent Number: EP4371942A3.
道格拉斯·乌尔里希 (2022). Electron beam exit window in isotope production. Patent Number: CN110402614B.
ウルリッヒ，ダグラス (2022). Electron beam exit window in isotope production. Patent Number: JP7162598B2.
Xueliang Sun; Xiaona Li; Jianwen LIANG; Changhong Wang; Huan Huang et al. (2022). SOLID ELECTROLYTE MATERIAL FOR LITHIUM SECONDARY BATTERY, ELECTRODE AND BATTERY. Patent Number: EP3965199A4.
孙学良; 李晓娜; 梁剑文; 王长虹; 黄欢 et al. (2023). Secondary battery solid electrolyte material and its preparation method and application. Patent Number: CN111916820B.
Andrew Garrison Clark; Jeffrey Michael Wong; Aijun Zhu; Shuang Zhang (2026). Method for density measurement of materials using computed tomography with diffraction artifact correction. Patent Number: US12584838B2.
クラーク・アンドリュー・ギャリソン; ウォン・ジェフリー・マイケル; チュー・アイジュン; チャン・ショワン (2025). Material density measurement by computed tomography with diffraction artifact correction.. Patent Number: JP2025522860A.