| Qi; Peng; Shi; Xianbo; Samadi et al. (2019). Focusing and energy dispersion properties of a cylindrically bent asymmetric Laue crystal.  SPIE, 2019.  10.1117/12.2525449. | BMIT-BM | Conference Proceeding | Materials | 
		
		    
    | Samadi; N.; Dallin; L.; Chapman et al. (2019). A vertical phase space beam position and emittance monitor for synchrotron radiation. In 7 th Int. Beam Instrumentation Conf., IBIC2018, Shanghai, China.  JACoW Publishing. , 186-189 10.18429/JACoW-IBIC2018-TUOB04. | BMIT-BM | Conference Proceeding | Materials | 
		
		    
    | Samadi; N.; Shi; X; Dallin et al. (2019). Application of a phase space beam position and size monitor for synchrotron radiation. In 10th Int. Partile Accelerator Conf, IPAC2019, Melbourne, Australia.  JACoW Publishing. , 4376-4379 10.18429/JACoW-IPAC2019-FRXXPLS3. | BMIT-BM | Conference Proceeding | Materials | 
		
		    
    | Luo; Peng; Li; Sheng; Knorr et al. (2018). Underlying Mechanisms of Tight Reservoir Wettability and Its Alteration. In Proceedings - SPE Symposium on Improved Oil Recovery.  . , 1-15 10.2118/190214-ms. | BMIT-ID | Conference Proceeding | Materials | 
		
		    
    | Lin; Linda; Chen; Ning; Khrushchev et al. (2019). CLS HXMA 2.0 T superconducting Wiggler upgrades.  .  10.1063/1.5084569. | HXMA | Conference Proceeding | Materials | 
		
		    
    | Black, Gillian; Cui, Xiaoyu; Gorovikov, Sergey; He, Feizhu; Henneberg, Grant et al. (2019). EUV Stokes reflection polarimeter using gold coated mirrors for use up to 150 eV photon energy.  .  10.1117/12.2528826. | QMSC, VLS-PGM | Conference Proceeding | Materials | 
		
		    
    | McLeod, J. A. (2018). Correlating Electronic Structure of Metal Oxide Nanomaterials to Device Performance Using Synchrotron-Excited X-Ray Spectroscopy.  .  10.1109/asdam.2018.8544465. | REIXS | Conference Proceeding | Materials | 
		
		    
    | Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. | SGM, SM | Conference Proceeding | Materials | 
		
		    
    | Park, J (2019). STXM Study on Layered Nanomaterials: Graphene & TMD. Microscopy and Microanalysis 25(S2) , 2102-2103. 10.1017/s1431927619011243. | SM | Conference Proceeding | Materials | 
		
		    
    | Kolmakov, Andrei; Strelcov, Evgheni; Guo, Hongxuan; Yulaev, Alexander; Hoskins, Brian et al. (2018). Graphene windows enable photoelectron microscopies of liquid samples.. Microscopy and Microanalysis 24(S2) , 68-71. 10.1017/s1431927618012746. | SM | Conference Proceeding | Materials | 
		
		    
    | Melo, Lis G.A.; Hitchcock, Adam P. (2018). Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer.. Microscopy and Microanalysis 24(S2) , 460-461. 10.1017/s1431927618014538. | SM | Conference Proceeding | Materials | 
		
		    
    | Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C. et al. (2018). Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells. Microscopy and Microanalysis 24(S2) , 434-435. 10.1017/s1431927618014423. | SM | Conference Proceeding | Materials | 
		
		    
    | Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. | SM | Conference Proceeding | Materials | 
		
		    
    | Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. | SGM, SM | Conference Proceeding | Materials | 
		
		    
    | Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. | SM | Conference Proceeding | Materials |