Publication Beamlines Strategic Pillar
Putz, Andreas Michael Vincent; Susac, Darija; Berejnov, Viatcheslav; Wu, Juan; Hitchcock, Adam P et al. (2016). (Plenary) Doing More with Less: Challenges for Catalyst Layer Design. ECS Transactions 75(14) , 3-23. 10.1149/07514.0003ecst. SM
Okbinoglu; Tulin; Kennepohl; Pierre (2020). The Nature of S-N Bonding in Sulfonamides and Related Compounds: Insights into π-Bonding Contributions from Sulfur K-Edge XAS. Patent Number: 10.26434/chemrxiv.13204985.v1. SXRMB
LI, Zexia; Zhang, Mingze; Wang, Lili; LI, Yizhan (2025). A Novel Type Collaboration: Global Big Science Facilities Co-utilization. . 10.51408/issi2025_121.
Hitchcock; A. P.; Qin; Z.; Rosendahl et al. (2016). Electro-deposition of Cu studied with in situ electrochemical scanning transmission x-ray microscopy. Patent Number: 10.1063/1.4937497. SM
Hitchcock; A. P.; Lee; V.; Wu et al. (2016). Characterizing automotive fuel cell materials by soft x-ray scanning transmission x-ray microscopy. Patent Number: 10.1063/1.4937506. SM
Heredia; Emilio; Yates; Brian; Chernikov et al. (2019). Ray tracing based performance optimization of an x-ray beamline that incorporates a sagittally curved mirror. . 10.1063/1.5084640. BIOXAS-SIDE
Durnberg, Erik; Knipe, Kevin; Freihofer, Gregory; Hanhan, Imad; Feng, Renfei et al. (2015). Particle Size Effect on Load Transfer in Single Particle Composite Samples via X-Ray Diffraction. . 10.2514/6.2015-1124. VESPERS
Cheng; H. Y.; Chien; W. C.; Kuo et al. (2017). An ultra high endurance and thermally stable selector based on TeAsGeSiSe chalcogenides compatible with BEOL IC Integration for cross-point PCM. . 10.1109/iedm.2017.8268310. IDEAS
Breil; N.; Carr; A.; Kuratomi et al. (2017). Highly-selective superconformai CVD Ti silicide process enabling area-enhanced contacts for next-generation CMOS architectures. . 10.23919/vlsit.2017.7998177. IDEAS
Agyeman-Budu; David N.; Choudhury; Sanjukta; Coulthard et al. (2016). Germanium collimating micro-channel arrays for high resolution, high energy confocal X-ray fluorescence microscopy. Patent Number: 10.1063/1.4961132. CLS-APS