Publication Beamlines Strategic Pillar
Cheng; H. Y.; Chien; W. C.; Kuo et al. (2017). An ultra high endurance and thermally stable selector based on TeAsGeSiSe chalcogenides compatible with BEOL IC Integration for cross-point PCM. . 10.1109/iedm.2017.8268310. IDEAS
Cheng, H. Y.; Chien, W C.; Kuo, I. T.; Yang, C. H.; Chou, Y. C. et al. (2021). Optimizing AsSeGe Chalcogenides by Dopants for Extremely Low IOFF, High Endurance and Low Vth Drift 3D Crosspoint Memory. . 10.1109/iedm19574.2021.9720704. BXDS-WLE Materials
Cheng, H. Y.; Chien, W. C.; Kuo, I. T.; Yeh, C. W.; Gignac, L. et al. (2018). Ultra-High Endurance and Low I<inf>OFF</inf> Selector based on AsSeGe Chalcogenides for Wide Memory Window 3D Stackable Crosspoint Memory. None. 10.1109/iedm.2018.8614580. IDEAS Materials
Cheng, H. Y.; Grun, A.; Chien, W C.; Yeh, C. W.; Ray, A. et al. (2022). New Phase-Change Materials by Atomic-Level Engineering the Dopants for Extremely Low Vth Drift at 85 °C and High Endurance 3D Crosspoint Memory : IBM/Macronix PCRAM Joint Project. . 10.1109/iedm45625.2022.10019562. BXDS-WLE Materials
Cheng, H. Y.; Kuo, I. T.; Chien, W. C.; Yeh, C. W.; Chou, Y. C. et al. (2020). Si Incorporation into AsSeGe Chalcogenides for High Thermal Stability, High Endurance and Extremely Low Vth Drift 3D Stackable Cross-Point Memory. None. 10.1109/vlsitechnology18217.2020.9265039. IDEAS Materials
Cheng, H. Y.; Liu, Z. L.; Majumdar, A.; Grun, A.; Ray, A. et al. (2024). State-Independent Low Resistance Drift SiSbTe Phase Change Memory for Analog In-Memory Computing Applications. . , 1-2 10.1109/vlsitechnologyandcir46783.2024.10631376. BXDS-WLE Materials
Chen, Ziyi; Walsh, Andrew; wei, xiao; Zhu, Manzhou; Zhang, Peng et al. (2020). Site-Specific Electronic Properties of [Ag25(SR)18]- Nanoclusters by X-Ray Spectroscopy. Patent Number: 10.26434/chemrxiv.13225199.v1. CLS-APS Materials
Chen, Ziyi; Walsh, Andrew; Wei, Xiao; Zhu, Manzhou; Zhang, Peng et al. (2022). New Insights into the Bonding Properties of [Ag25(SR)18]- Nanoclusters from X-ray Absorption Spectroscopy. Patent Number: 10.26434/chemrxiv-2022-mt480. CLS-APS Materials
Chevalier; S.; Banerjee; R.; Lee et al. (2016). In situ liquid water visualization in polymer electrolyte membrane fuel cells with high resolution synchrotron x-ray radiography. In AIP Conference Proceedings. . , 050006-1 – 050006-4 10.1063/1.4952926. BMIT-BM Materials
Cron, Brandi; Macalady, Jennifer L.; Cosmidis, Julie (2021). Organic stabilization of extracellular elemental sulfur in a Sulfurovum-rich biofilm: a new role for EPS?. Patent Number: 10.1101/2021.06.03.446708. Environment
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
Dogan Paktunc, Michael C. Moncur, S. Jean Birks, John J. Gibson, Yi Yi (2015). Predicting the mobilization of dissolved metals, organics and gas Predicting the mobilization of dissolved metals, organics and gas Predicting the mobilization of dissolved metals, organics and gas Predicting the mobilization of dissolved metals, organics. Canada: Integrated Water Management, Alberta Innovates – Technology Futures, CANMET Mining and Mineral Scie. http://www.geoconvention.com/archives/2015/258_GC2015_Predicting_the_mobilization_of_dissolved_metals.pdf. CLS-APS Environment
Durnberg, Erik; Knipe, Kevin; Freihofer, Gregory; Hanhan, Imad; Feng, Renfei et al. (2015). Particle Size Effect on Load Transfer in Single Particle Composite Samples via X-Ray Diffraction. . 10.2514/6.2015-1124. VESPERS
Dydula; Christopher; Belev; George; Johns et al. (2017). Accelerated x-ray scatter projection imaging using multiple continuously moving pencil beams. In Progress in Biomedical Optics and Imaging - Proceedings of SPIE. . , 101324J 10.1117/12.2253720. BMIT-ID Materials
Dynes, James J.; Arthur, Zachary; Read, Stuart; Stobbs, Jarvis; Regier, Tom Z. et al. (2018). Correlative Spectromicroscopy Software Development on the SGM and Mid-IR Beamlines at the CLS. Microscopy and Microanalysis 24(S2) , 494-495. 10.1017/s1431927618014708. MID-IR, SGM Environment