Publication Beamlines Strategic Pillar
de Boer, Tristan LC (2020). Advancing the Characterization of Semiconductors with Synchrotron Radiation. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/13232. REIXS, SGM, VLS-PGM Materials
de Boer, Tristan LC (2020). Advancing the Characterization of Semiconductors with Synchrotron Radiation. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/13232. REIXS, SGM, VLS-PGM Materials
de Boer, Tristan LC (2020). Advancing the Characterization of Semiconductors with Synchrotron Radiation. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/13232. REIXS, SGM, VLS-PGM Materials
de Boer, Tristan; Häusler, Jonas; Strobel, Philipp; Boyko, Teak D.; Rudel, Stefan S. et al. (2021). Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2. Journal of Physical Chemistry C 125(51) . 10.1021/acs.jpcc.1c08115. REIXS, VLS-PGM Materials
de Boer, Tristan; Häusler, Jonas; Strobel, Philipp; Boyko, Teak D.; Rudel, Stefan S. et al. (2021). Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2. Journal of Physical Chemistry C 125(51) . 10.1021/acs.jpcc.1c08115. REIXS, VLS-PGM Materials
de Boer, Tristan; Fattah, Md. Fahim Al; Amin, Muhammad Ruhul; Ambach, Sebastian J.; Vogel, Sebastian et al. (2022). Band gap and electronic structure of defects in the ternary nitride BP3N6: experiment and theory. Journal of Materials Chemistry C 10(16) , 6429-6434. 10.1039/d1tc06009k. VLS-PGM Materials
de Boer, Tristan; Boyko, Teak D.; Braun, Cordula; Schnick, Wolfgang; Moewes, Alexander et al. (2015). Band gap and electronic structure of MgSiN2determined using soft X-ray spectroscopy and density functional theory. Physica Status Solidi - Rapid Research Letters 9(4) , 250-254. 10.1002/pssr.201510043. REIXS
de Boer, Tristan; Boyko, Teak D.; Braun, Cordula; Schnick, Wolfgang; Moewes, Alexander et al. (2022). Bandgap and electronic structure of CaSiN 2 : Experiment and theory. International Journal of Applied Ceramic Technology . 10.1111/ijac.14137. SGM Materials
de Boer, T.; Bekheet, M. F.; Gurlo, A.; Riedel, R.; Moewes, A. et al. (2016). Band gap and electronic structure of cubic, rhombohedral, and orthorhombicIn2O3polymorphs: Experiment and theory. Physical Review B 93(15) . 10.1103/physrevb.93.155205. REIXS
de A. Melo, Lis G.; Hitchcock, Adam P.; Berejnov, Viatcheslav; Susac, Darija; Stumper, Juergen et al. (2016). Evaluating focused ion beam and ultramicrotome sample preparation for analytical microscopies of the cathode layer of a polymer electrolyte membrane fuel cell. Journal of Power Sources 312, 23-35. 10.1016/j.jpowsour.2016.02.019. SM
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
D’Costa, Vanessa M.; Braun, Virginie; Landekic, Marija; Shi, Rong; Proteau, Ariane et al. (2015). Salmonella Disrupts Host Endocytic Trafficking by SopD2-Mediated Inhibition of Rab7. Cell Reports 12(9) , 1508-1518. 10.1016/j.celrep.2015.07.063. [PDB: 5cq9] CMCF-ID Health
Day, R. P.; Na, M. X.; Zingl, M.; Zwartsenberg, B.; Michiardi, M. et al. (2022). Three-dimensional electronic structure of LiFeAs. Physical Review B 105(15) . 10.1103/physrevb.105.155142. QMSC Materials
Dawkins, Jeremy I. G.; Pan, Yani; Ghavidel, Mohammadreza Z.; Geissler, Johann; Krueger, Bastian et al. (2023). Exploring the Synergistic Effects of Dual‐Layer Electrodes for High Power Li‐Ion Batteries. ChemElectroChem 10(21) . 10.1002/celc.202300279. VESPERS Materials
Dawkins, Jeremy I. G.; Ghavidel, Mohammadreza Z.; Chhin, Danny; Beaulieu, Isabelle; Hossain, Md Sazzad et al. (2020). Operando Tracking of Solution-Phase Concentration Profiles in Li-Ion Battery Positive Electrodes Using X-ray Fluorescence. Analytical Chemistry 92(16) . 10.1021/acs.analchem.0c02086. VESPERS Materials