Publication Beamlines Strategic Pillar
Srivastava, K.; Boyle, N. D.; Jorissen, K.F.A; Burgess, I. J.; Van Der Stam, W. et al. (2022). ATR microreactor: A tool for in-situ and spatial reaction monitoring. . 10.1109/sensors52175.2022.9967095. MID-IR Materials
Black, Gillian; Cui, Xiaoyu; Gorovikov, Sergey; He, Feizhu; Henneberg, Grant et al. (2019). EUV Stokes reflection polarimeter using gold coated mirrors for use up to 150 eV photon energy. . 10.1117/12.2528826. QMSC, VLS-PGM Materials
Liu, Yihong; Sun, Jiawei; McLeod, John A.; Deng, Ruoxin; Lee, Clement et al. (2024). Mn2+-Doped (Mg,Zn)Xgeoy Nanoparticles with Tunable, Excitation-Energy-Dependent Multi-Color Persistent Luminescence. Patent Number: 10.2139/ssrn.5042460. REIXS, SXRMB, VESPERS Materials
McLeod, J. A. (2018). Correlating Electronic Structure of Metal Oxide Nanomaterials to Device Performance Using Synchrotron-Excited X-Ray Spectroscopy. . 10.1109/asdam.2018.8544465. REIXS Materials
Khan, Mohd Adnan; Nabil, Shariful; Al-Attas, Tareq A.; Roy, Soumyabrata; Rahman, M.M. et al. (2020). Electrochemical Reduction of CO2 to Ethylene with 32% Lower Energy at 80% Lower Cost via Coproduction of Glycolic Acid. Patent Number: 10.26434/chemrxiv.13331204.v1. SGM Materials
Leontowich, A F G; Taylor, D M; Wang, J; Regier, C N; Regier, T Z et al. (2017). Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray microscope. Journal of Physics: Conference Series 849, 012045. 10.1088/1742-6596/849/1/012045. SGM, SM Materials
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. SGM, SM Materials
Berejnov, Viatcheslav; Saha, Madhu; Susac, Darija; Stumper, Juergen; West, Marcia et al. (2017). Advances in Structural Characterization Using Soft X-ray Scanning Transmission Microscopy (STXM): Mapping and Measuring Porosity in PEM-FC Catalyst Layers. ECS Transactions 80(8) , 241-252. 10.1149/08008.0241ecst. SM Materials
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
G. A. Melo, Lis; Hitchcock, Adam P; Jankovic, Jasna; Stumper, Jürgen; Susac, Darija et al. (2017). Quantitative Mapping of Ionomer in Catalyst Layers by Electron and X-ray Spectromicroscopy. ECS Transactions 80(8) , 275-282. 10.1149/08008.0275ecst. SM Materials
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. SM Materials
Hitchcock, A. P.; Wu, J.; Lee, V.; Appathurai, N.; Tyliszczak, T. et al. (2016). Progress in Soft X-ray Microscopy Characterization of PEM Fuel Cell Catalyst Layers. Microscopy and Microanalysis 22(S3) , 1290-1291. 10.1017/s1431927616007297. SM Materials
Kolmakov, Andrei; Strelcov, Evgheni; Guo, Hongxuan; Yulaev, Alexander; Hoskins, Brian et al. (2018). Graphene windows enable photoelectron microscopies of liquid samples.. Microscopy and Microanalysis 24(S2) , 68-71. 10.1017/s1431927618012746. SM Materials
Leontowich, A F G; Taylor, D M; Wang, J; Regier, C N; Regier, T Z et al. (2017). Low background, UHV compatible scintillator detector for the CLS cryo scanning soft X-ray microscope. Journal of Physics: Conference Series 849, 012045. 10.1088/1742-6596/849/1/012045. SGM, SM Materials
Melo, Lis G.A.; Hitchcock, Adam P. (2018). Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer.. Microscopy and Microanalysis 24(S2) , 460-461. 10.1017/s1431927618014538. SM Materials