Morin Caamano, Tatiana; Houache, Mohamed S. E.; Couillard, Martin; Turnbull, Matthew; Zhou, Jigang et al. (2023). Plasmon-Enhanced Co2 Electroreduction on Copper, Silver, and Copper-Silver Nano-Electrocatalysts. Patent Number: 10.2139/ssrn.4592365. |
SM, SXRMB |
Conference Proceeding |
Materials |
Okbinoglu; Tulin; Kennepohl; Pierre (2020). The Nature of S-N Bonding in Sulfonamides and Related Compounds: Insights into π-Bonding Contributions from Sulfur K-Edge XAS. Patent Number: 10.26434/chemrxiv.13204985.v1. |
SXRMB |
Conference Proceeding |
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Fu, C H; Wang, J C; Hu, Y F; Wang, M J; Zhang, Y L et al. (2013). Analyses on Forms of Sulfurin Chinese Yanzhou Coal and Their Transformation during Pyrolysis by X-ray Absorption Spectroscopy. Journal of Physics: Conference Series 430, 012096. 10.1088/1742-6596/430/1/012096. |
SXRMB |
Conference Proceeding |
|
Guo, X X; Sham, T K; Zhu, Y J; Hu, Y F (2013). Interaction of Nanostructured Calcium Silicate Hydrate with Ibuprofen Drug Molecules: X-ray Absorption Near Edge Structure (XANES) Study at the Ca, Si and O K-edge. Journal of Physics: Conference Series 430, 012064. 10.1088/1742-6596/430/1/012064. |
SGM, SXRMB |
Conference Proceeding |
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Yiu, Y. M.; Murphy, M. W.; Liu, L.; Hu, Y.; Sham, T. K. et al. (2014). Experimental and theoretical XANES of CdSxSe1−x nanostructures. AIP Conference Proceedings , 26-31. 10.1063/1.4870191. |
CLS-APS, SGM, SXRMB |
Conference Proceeding |
|
Khatami, Zahra; Wilson, Patrick Robert James; Taggart, Owen; Frisina, Dan R; Wojcik, Jacek et al. (2014). Structural and Optical Properties of Luminescent Silicon Carbonitride Thin Films. ECS Transactions 61(5) , 97-103. 10.1149/06105.0097ecst. |
SGM, SXRMB |
Conference Proceeding |
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Morin Caamano, Tatiana; Houache, Mohamed S. E.; Couillard, Martin; Turnbull, Matthew; Zhou, Jigang et al. (2023). Plasmon-Enhanced Co2 Electroreduction on Copper, Silver, and Copper-Silver Nano-Electrocatalysts. Patent Number: 10.2139/ssrn.4592365. |
SM, SXRMB |
Conference Proceeding |
Materials |
Zhang, Chunyang; Eraky, Haytham; Ingino, Pablo; Obst, Martin; Wang, Jian et al. (2023). In-situ STXM characterization of Cu/Cu2O electrocatalysts for CO2 reduction. AIP Conference Proceedings . 10.1063/5.0168124. |
SM |
Conference Proceeding |
Materials |
Park, J (2019). STXM Study on Layered Nanomaterials: Graphene & TMD. Microscopy and Microanalysis 25(S2) , 2102-2103. 10.1017/s1431927619011243. |
SM |
Conference Proceeding |
Materials |
Kolmakov, Andrei; Strelcov, Evgheni; Guo, Hongxuan; Yulaev, Alexander; Hoskins, Brian et al. (2018). Graphene windows enable photoelectron microscopies of liquid samples.. Microscopy and Microanalysis 24(S2) , 68-71. 10.1017/s1431927618012746. |
SM |
Conference Proceeding |
Materials |
Melo, Lis G.A.; Hitchcock, Adam P. (2018). Optimizing Soft X-ray Spectromicroscopy for Fuel Cell Studies: X-ray Damage of Ionomer.. Microscopy and Microanalysis 24(S2) , 460-461. 10.1017/s1431927618014538. |
SM |
Conference Proceeding |
Materials |
Stuckelberger, M. E.; Nietzold, T.; West, B. M.; Walker, T.; Ossig, C. et al. (2018). Challenges and Opportunities with Highly Brilliant X-ray Sources for multi-Modal in-Situ and Operando Characterization of Solar Cells. Microscopy and Microanalysis 24(S2) , 434-435. 10.1017/s1431927618014423. |
SM |
Conference Proceeding |
Materials |
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. |
SM |
Conference Proceeding |
Materials |
Wang, Zhiqiang; Wang, Jian; Hou, Dejian; Sham, Tsun-Kong (2018). Imaging of Individual Eu Doped Y2O3 Sub-microspheres Using Photoluminescence Yield: An Application of Scanning Transmission X-ray Microscopy in Luminescent Materials. Microscopy and Microanalysis 24(S2) , 480-481. 10.1017/s1431927618014630. |
SGM, SM |
Conference Proceeding |
Materials |
Wang, Jian; Jan Geilhufe,; Lu, Yingshen; Dynes, James J.; Zhou, Jigang et al. (2018). Soft X-ray Spectromicroscopy at the Canadian Light Source. Microscopy and Microanalysis 24(S2) , 230-231. 10.1017/s1431927618013491. |
SM |
Conference Proceeding |
Materials |