Publication Beamlines Strategic Pillar
Kaur, Khushveer; King, Graham; Grosvenor, Andrew P. (2025). Examining Order–Disorder Structural Transition of Gd2Zr2–xCexO7 Using Synchrotron Techniques. Inorganic Chemistry . 10.1021/acs.inorgchem.4c04795. BXDS-WHE, HXMA Materials
Kaur, Khushveer; King, Graham; Grosvenor, Andrew P. (2025). Examining Order–Disorder Structural Transition of Gd2Zr2–xCexO7 Using Synchrotron Techniques. Inorganic Chemistry . 10.1021/acs.inorgchem.4c04795. BXDS-WHE, HXMA Materials
Kaur, Simranjeet; D’Souza, Renita M.; Kelly, Timothy L.; Williams, Vance E.; Kaake, Loren G. et al. (2024). Electrostatic Correlations Lead to High Capacitance in Zwitterion-Containing Thin Films. ACS Applied Materials and Interfaces 16(29) , 38290-38299. 10.1021/acsami.4c01045. BXDS-WLE Materials
Keegan, Brenna C.; Ocampo, Daniel; Shearer, Jason (2019). pH Dependent Reversible Formation of a Binuclear Ni2 Metal-Center within a Peptide Scaffold. Inorganics 7(7) , 90. 10.3390/inorganics7070090. HXMA Materials
Keller, Marlou; Eisenmann, Tobias; Meira, Debora; Aquilanti, Giuliana; Buchholz, Daniel et al. (2019). In Situ Investigation of Layered Oxides with Mixed Structures for Sodium‐Ion Batteries. Small Methods 3(11) , 1900239. 10.1002/smtd.201900239. CLS-APS Materials
Kelly, Joel A.; Henderson, Eric J.; Clark, Rhett J.; Hessel, Colin M.; Cavell, Ronald G. et al. (2010). X-ray Absorption Spectroscopy of Functionalized Silicon Nanocrystals. Journal of Physical Chemistry C 114(51) , 22519-22525. 10.1021/jp1092948. SGM, VLS-PGM Materials
Kelly, Joel A.; Henderson, Eric J.; Clark, Rhett J.; Hessel, Colin M.; Cavell, Ronald G. et al. (2010). X-ray Absorption Spectroscopy of Functionalized Silicon Nanocrystals. Journal of Physical Chemistry C 114(51) , 22519-22525. 10.1021/jp1092948. SGM, VLS-PGM Materials
Kelly, Joel A.; Henderson, Eric J.; Hessel, Colin M.; Cavell, Ronald G.; Veinot, Jonathan G.C. et al. (2010). Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 268(3-4) , 246-250. 10.1016/j.nimb.2009.09.040. SGM, VLS-PGM Materials
Kelly, Joel A.; Henderson, Eric J.; Hessel, Colin M.; Cavell, Ronald G.; Veinot, Jonathan G.C. et al. (2010). Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 268(3-4) , 246-250. 10.1016/j.nimb.2009.09.040. SGM, VLS-PGM Materials
Ketabi, Niloofar; de Boer, Tristan; Karakaya, Mehmet; Zhu, Jingyi; Podila, Ramakrishna et al. (2016). Tuning the electronic structure of graphene through nitrogen doping: experiment and theory. RSC Advances 6(61) , 56721-56727. 10.1039/c6ra07546k. REIXS, SGM Materials
Ketabi, Niloofar; de Boer, Tristan; Karakaya, Mehmet; Zhu, Jingyi; Podila, Ramakrishna et al. (2016). Tuning the electronic structure of graphene through nitrogen doping: experiment and theory. RSC Advances 6(61) , 56721-56727. 10.1039/c6ra07546k. REIXS, SGM Materials
Khatami, Zahra; Bleczewski, Lyndia; Neville, John J.; Mascher, Peter (2020). X-ray Absorption Spectroscopy of Silicon Carbide Thin Films Improved by Nitrogen for All-Silicon Solar Cells. ECS Journal of Solid State Science and Technology 9(8) , 083002. 10.1149/2162-8777/abb2b1. SGM, SXRMB Materials
Khatami, Zahra; Bleczewski, Lyndia; Neville, John J.; Mascher, Peter (2020). X-ray Absorption Spectroscopy of Silicon Carbide Thin Films Improved by Nitrogen for All-Silicon Solar Cells. ECS Journal of Solid State Science and Technology 9(8) , 083002. 10.1149/2162-8777/abb2b1. SGM, SXRMB Materials
Khatami, Zahra; Wilson, Patrick Robert James; Wojcik, Jacek; Mascher, Peter (2013). XANES and XES Studies of Luminescent Silicon Carbonitride Thin Films. ECS Transactions 50(41) , 49-56. 10.1149/05041.0049ecst. SGM, VLS-PGM Materials
Khatami, Zahra; Wilson, Patrick Robert James; Wojcik, Jacek; Mascher, Peter (2013). XANES and XES Studies of Luminescent Silicon Carbonitride Thin Films. ECS Transactions 50(41) , 49-56. 10.1149/05041.0049ecst. SGM, VLS-PGM Materials