Publication Beamlines Strategic Pillar
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, P.E.R. (2011). Examining the Electronic Structure of Metal Pnictides via X-ray Spectroscopy. Supervisor: Cavell, Ronald; Mar; Arthur. Canada, AB: University of Alberta. https://doi.org/10.7939/R3XQ6R. CLS-APS, HXMA, SGM, SXRMB, VESPERS, VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Effects of rare-earth substitution in the oxyarsenides REFeAsO (RE=Ce, Pr, Nd, Sm, Gd) and CeNiAsO by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1477-1483. 10.1016/j.jssc.2010.04.010. VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Blanchard, Peter E.R.; Grosvenor, Andrew P. (2018). Investigating the local structure of B-site cations in (1-x)BaTiO3–xBiScO3 and (1-x)PbTiO3–xBiScO3 using X-ray absorption spectroscopy. Solid State Sciences 79, 6-14. 10.1016/j.solidstatesciences.2018.02.018. CLS-APS, VESPERS Materials
Blanchard, Peter E.R.; Grosvenor, Andrew P. (2018). Investigating the local structure of B-site cations in (1-x)BaTiO3–xBiScO3 and (1-x)PbTiO3–xBiScO3 using X-ray absorption spectroscopy. Solid State Sciences 79, 6-14. 10.1016/j.solidstatesciences.2018.02.018. CLS-APS, VESPERS Materials
Blanton, Alicia; Islam, Taohedul; Roy, Subrata Chandra; Celik, Ahmet; Nie, Jing et al. (2023). Porous Semiconducting K–Sn–Mo–S Aerogel: Synthesis, Local Structure, and Ion-Exchange Properties. Chemistry of Materials 35(24) , 10446-10456. 10.1021/acs.chemmater.3c01675. BIOXAS-SPECTROSCOPY, VESPERS Materials
Blanton, Alicia; Islam, Taohedul; Roy, Subrata Chandra; Celik, Ahmet; Nie, Jing et al. (2023). Porous Semiconducting K–Sn–Mo–S Aerogel: Synthesis, Local Structure, and Ion-Exchange Properties. Chemistry of Materials 35(24) , 10446-10456. 10.1021/acs.chemmater.3c01675. BIOXAS-SPECTROSCOPY, VESPERS Materials
Bluschke, Martin (2020). Introduction to Antiferromagnetism in Ultrathin Nickelate Layers. , 105-117. 10.1007/978-3-030-47902-2_6. REIXS Materials
Bluschke, Martin; Gupta, Naman K.; Jang, Hoyoung; Husain, Ali. A.; Lee, Byungjune et al. (2024). Orbital-selective time-domain signature of nematicity dynamics in the charge-density-wave phase of La 1.65 Eu 0.2 Sr 0.15 CuO 4. Proceedings of the National Academy of Sciences of the United States of America 121(23) . 10.1073/pnas.2400727121. REIXS Materials
Boateng, Emmanuel; McGuire, Cameron; Xu, Ruzhen; Jiang, De-Tong; Chen, Aicheng et al. (2024). Effects of Heteroatom Doping on the Electrochemical Hydrogen Uptake and Release of Pd-Decorated Reduced Graphene Oxide. ACS Applied Materials and Interfaces 16(36) , 47703-47712. 10.1021/acsami.4c10351. HXMA Materials