Publication Beamlines Strategic Pillar
Anderson; D.; Warkentin; B.; Siegbahn et al. (2010). Dosimetry for Microbeam Radiation Therapy at the Canadian Light Source. In Forty-Sixth Annual Meeting of the Canadian organization of Medical Physicists and the Canadian College of Physicists in Medicine. . , 3904 https://doi.org/10.1118/1.3476189. BMIT-BM Materials
Bewer, Brian; Chapman, Dean (2010). Development of an x-ray prism for analyzer based imaging systems. Review of Scientific Instruments 81(8) , 085108. 10.1063/1.3478018. BMIT-BM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Effects of rare-earth substitution in the oxyarsenides REFeAsO (RE=Ce, Pr, Nd, Sm, Gd) and CeNiAsO by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1477-1483. 10.1016/j.jssc.2010.04.010. VLS-PGM Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials
Brian E. Bewer (2010). Development of an X-ray prism for a combined diffraction enhanced imaging and fluorescence imaging system. Supervisor: Chapman, Dean. Saskatchewan, Canada: University of Saskatchewan. https://ecommons.usask.ca/handle/10388/etd-10212010-105154. BMIT-BM, SYLMAND Materials
Brian E. Bewer (2010). Development of an X-ray prism for a combined diffraction enhanced imaging and fluorescence imaging system. Supervisor: Chapman, Dean. Saskatchewan, Canada: University of Saskatchewan. https://ecommons.usask.ca/handle/10388/etd-10212010-105154. BMIT-BM, SYLMAND Materials
Grosvenor, Andrew P.; Ramezanipour, Farshid; Derakhshan, Shahab; Maunders, Christian; Botton, Gianluigi A. et al. (2009). Effects of bond character on the electronic structure of brownmillerite-phase oxides, Ca2B′xFe2−xO5 (B′ = Al, Ga): an X-ray absorption and electron energy loss spectroscopic study. Journal of Materials Chemistry 19(48) , 9213. 10.1039/b914983j. SGM, VLS-PGM Materials
Grosvenor, Andrew P.; Ramezanipour, Farshid; Derakhshan, Shahab; Maunders, Christian; Botton, Gianluigi A. et al. (2009). Effects of bond character on the electronic structure of brownmillerite-phase oxides, Ca2B′xFe2−xO5 (B′ = Al, Ga): an X-ray absorption and electron energy loss spectroscopic study. Journal of Materials Chemistry 19(48) , 9213. 10.1039/b914983j. SGM, VLS-PGM Materials
Johns, PC; Bewer, BE; Chapman, LD (2009). Poster - Wed Eve-12: Initial Experiments in Monoenergetic X-Ray Scatter Imaging at the BioMedical Imaging and Therapy facility of the Canadian Light Source. Medical Physics 36(9Part2) , 4306-4306. 10.1118/1.3244116. BMIT-BM Materials
Johns; P.C.; Warkentin; B. (2010). Canadian Light Source now accepting Imaging and Therapy Users. In 2010 Canadian Organization of Medical Physicists. . , 46-47 https://www.comp-ocpm.ca/download.php?id=360. BMIT-BM Materials
Kelly, Joel A.; Henderson, Eric J.; Clark, Rhett J.; Hessel, Colin M.; Cavell, Ronald G. et al. (2010). X-ray Absorption Spectroscopy of Functionalized Silicon Nanocrystals. Journal of Physical Chemistry C 114(51) , 22519-22525. 10.1021/jp1092948. SGM, VLS-PGM Materials
Kelly, Joel A.; Henderson, Eric J.; Clark, Rhett J.; Hessel, Colin M.; Cavell, Ronald G. et al. (2010). X-ray Absorption Spectroscopy of Functionalized Silicon Nanocrystals. Journal of Physical Chemistry C 114(51) , 22519-22525. 10.1021/jp1092948. SGM, VLS-PGM Materials
Kelly, Joel A.; Henderson, Eric J.; Hessel, Colin M.; Cavell, Ronald G.; Veinot, Jonathan G.C. et al. (2010). Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 268(3-4) , 246-250. 10.1016/j.nimb.2009.09.040. SGM, VLS-PGM Materials
Kelly, Joel A.; Henderson, Eric J.; Hessel, Colin M.; Cavell, Ronald G.; Veinot, Jonathan G.C. et al. (2010). Soft X-ray spectroscopy of oxide-embedded and functionalized silicon nanocrystals. Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms 268(3-4) , 246-250. 10.1016/j.nimb.2009.09.040. SGM, VLS-PGM Materials