Publication Beamlines Strategic Pillar
Cathleen M. Crudden; J. Hugh Horton; Mina Raafat Ryad Narouz; Phillip Unsworth; Zhijun Li et al. (2019). Methods of Forming Carbene-Functionalized Composite Materials. Patent Number: US20190169132A1. SGM, SXRMB Materials
Castle, Rielly; Appathurai, Narayan; Simonson, Nicholas; Sigari, Yasaman; Boland, Mark J. et al. (2025). Investigating the limits of hard X-ray coherence length measurement employing Young’s double slit experiment. Scientific Reports 15(1) . 10.1038/s41598-025-03295-y. BXDS, SM Materials
Carrillo, J. Luis; Ezazi, Andrew A.; Perez-Beltran, Saul; Larriuz, Carlos A.; Kohl, Harris et al. (2025). Electrochemical 6Li isotope enrichment based on selective insertion in 1D tunnel-structured V2O5. Chem , 102486. 10.1016/j.chempr.2025.102486. SM, VLS-PGM Materials
Carolyn C. F Cadogan (2018). Properties of Si quantum dots. Supervisor: Simpson, Peter J.. Canada: The University of Western Ontario. https://www.proquest.com/docview/2714866774?pq-origsite=gscholar&fromopenview=true&sourcetype=Dissertations%20&%20Theses. SGM, SXRMB, VLS-PGM Materials
Cao, Chuntian; Toney, Michael F.; Sham, Tsun-Kong; Harder, Ross; Shearing, Paul R. et al. (2020). Emerging X-ray imaging technologies for energy materials. Materials Today 34, 132-147. 10.1016/j.mattod.2019.08.011. SGM, SXRMB, VLS-PGM Materials
Calderon, Oliver; Birss, Viola I.; Trudel, Simon (2025). Design and commissioning of a high-temperature electrochemical cell for hard x-ray ray in-operando studies. Canadian Journal of Chemistry . 10.1139/cjc-2024-0260. HXMA, SXRMB Materials
Burgess, Ian J.; Morhart, Tyler A.; Flaman, Grace T.; Boyle, Nicole D.; Deng, Tiangyang et al. (2025). Into the Groove: Analytical Applications of ATR-FTIR Microstructured Internal Reflection Elements. Analytical Chemistry . 10.1021/acs.analchem.4c05431. MID-IR, SYLMAND Materials
Brian E. Bewer (2010). Development of an X-ray prism for a combined diffraction enhanced imaging and fluorescence imaging system. Supervisor: Chapman, Dean. Saskatchewan, Canada: University of Saskatchewan. https://ecommons.usask.ca/handle/10388/etd-10212010-105154. BMIT-BM, SYLMAND Materials
Boyko, Teak (2013). Exploring the hardness of nitride ceramics: Electronic properties and band gap studied using soft X-ray spectroscopy. Supervisor: Moewes, Alexander. SK, Canada: University of Saskatchewan. . REIXS, SGM Materials
Bond, Toby; Gauthier, Roby; King, Graham; Dressler, Reid; Abraham, Jeffin James et al. (2024). The Complex and Spatially Heterogeneous Nature of Degradation in Heavily Cycled Li-ion Cells. Journal of the Electrochemical Society . 10.1149/1945-7111/ad88a8. BMIT-BM, BXDS-WHE Materials
Bond, Toby; Gauthier, Roby; Gasilov, Sergey; Dahn, J. R. (2022). In-Situ Computed Tomography of Particle Microcracking and Electrode Damage in Cycled NMC622/Graphite Pouch Cell Batteries. Journal of the Electrochemical Society 169(8) , 080531. 10.1149/1945-7111/ac8a22. BMIT-BM, BMIT-ID Materials
Bolibruch; N.I.; Vogt; J.M.; Igarashi et al. (2011). Photodiode Calibration using an Electrical Substitution Radiometer in the Hard X-Ray Region. In Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators. Joint Accelerator Conferences Website (JACoW). , 500-502 https://accelconf.web.cern.ch/accelconf/DIPAC2011/papers/tupd83.pdf. BMIT-BM, HXMA Materials
BoHoon Kim (2015). Tribological Performance of Ashless Anti-wear Additives under Extreme Pressure. Supervisor: Aswath, Pranesh B. Arlington, Texas, USA: University of Texas at Arlington. . SGM, SXRMB, VLS-PGM Materials
Blanton, Alicia; Islam, Taohedul; Roy, Subrata Chandra; Celik, Ahmet; Nie, Jing et al. (2023). Porous Semiconducting K–Sn–Mo–S Aerogel: Synthesis, Local Structure, and Ion-Exchange Properties. Chemistry of Materials 35(24) , 10446-10456. 10.1021/acs.chemmater.3c01675. BIOXAS-SPECTROSCOPY, VESPERS Materials
Blanchard, Peter E.R.; Cavell, Ronald G.; Mar, Arthur (2010). Electronic structure of ZrCuSiAs and ZrCuSiP by X-ray photoelectron and absorption spectroscopy. Journal of Solid State Chemistry 183(7) , 1536-1544. 10.1016/j.jssc.2010.04.032. SXRMB, VLS-PGM Materials