Publication Beamlines Strategic Pillar
Ho, Josha; de Boer, Tristan; Braun, Patrick M.; Leedahl, Brett; Manikandan, Dhamodaran et al. (2020). Origin and control of room temperature ferromagnetism in Co,Zn-doped SnO2: oxygen vacancies and their local environment. Journal of Materials Chemistry C 8(14) . 10.1039/c9tc06830a. REIXS, SGM Materials
Luo, Dan; Zhang, Zhen; Li, Gaoran; Cheng, Shaobo; Li, Shuang et al. (2020). Revealing the Rapid Electrocatalytic Behavior of Ultrafine Amorphous Defective Nb2O5–x Nanocluster toward Superior Li–S Performance. ACS Nano 14(4) , 4849-4860. 10.1021/acsnano.0c00799. BIOXAS-SIDE, BXDS-WLE, SXRMB, VESPERS Materials
Barrett, William; Shen, Jing; Hu, Yongfeng; Hayes, Robert E.; Scott, Robert W. J. et al. (2019). Understanding the Role of SnO 2 Support in Water‐Tolerant Methane Combustion: In situ Observation of Pd(OH) 2 and Comparison with Pd/Al 2 O 3. ChemCatChem 12(3) , 944-952. 10.1002/cctc.201901744. HXMA, SXRMB Materials
Li, Weihan; Wang, Zhiqiang; Zhao, Feipeng; Li, Minsi; Gao, Xuejie et al. (2020). Phosphorene Degradation: Visualization and Quantification of Nanoscale Phase Evolution by Scanning Transmission X-ray Microscopy. Chemistry of Materials 32(3) , 1272-1280. 10.1021/acs.chemmater.9b04811. CLS-APS, SM, SXRMB, VLS-PGM Materials
Qamar, Amir; Amin, Muhammad Ruhul; Grynko, Oleksandr; Semeniuk, Oleksii; Reznik, Alla et al. (2019). A Probe of Valence and Conduction Band Electronic Structure of Lead Oxide Films for Photodetectors. ChemPhysChem 20(24) , 3328-3335. 10.1002/cphc.201900726. REIXS, SGM Materials
Alabi, Wahab O.; Sulaiman, Kazeem O.; Wang, Hui; Hu, Yongfeng; Patzig, Christian et al. (2020). Effect of spinel inversion and metal-support interaction on the site activity of Mg-Al-Ox supported Co catalyst for CO2 reforming of CH4. Journal of CO2 Utilization 37, 180-187. 10.1016/j.jcou.2019.12.006. SGM, SXRMB Materials
Liu, Min; Liu, Mengxia; Wang, Xiaoming; Kozlov, Sergey M.; Cao, Zhen et al. (2019). Quantum-Dot-Derived Catalysts for CO2 Reduction Reaction. Joule 3(7) , 1703-1718. 10.1016/j.joule.2019.05.010. CLS-APS, SXRMB Materials
Xiao, Wei; Sun, Qian; Banis, Mohammad Norouzi; Wang, Biqiong; Liang, Jianneng et al. (2019). Unveiling the Interfacial Instability of the Phosphorus/Carbon Anode for Sodium-Ion Batteries. ACS Applied Materials and Interfaces 11(34) , 30763-30773. 10.1021/acsami.9b07884. SXRMB, VLS-PGM Materials
Jiang, Kun; Back, Seoin; Akey, Austin J.; Xia, Chuan; Hu, Yongfeng et al. (2019). Highly selective oxygen reduction to hydrogen peroxide on transition metal single atom coordination. Nature Communications 10(1) . 10.1038/s41467-019-11992-2. HXMA, SXRMB Materials
Morhart, Tyler A.; Read, Stuart T.; Wells, Garth; Jacobs, Michael; Rosendahl, Scott M. et al. (2019). Micromachined multigroove silicon ATR FT-IR internal reflection elements for chemical imaging of microfluidic devices. Analytical Methods 11(45) . 10.1039/c9ay02248a. MID-IR, SYLMAND Materials
Barbi, Mauricio; Bell, Phil R.; Fanti, Federico; Dynes, James J.; Kolaceke, Anezka et al. (2019). Integumentary structure and composition in an exceptionally well-preserved hadrosaur (Dinosauria: Ornithischia). PeerJ 7, e7875. 10.7717/peerj.7875. MID-IR, SM, VESPERS Materials
Khatami, Zahra; Wilson, Patrick Robert James; Wojcik, Jacek; Mascher, Peter (2013). XANES and XES Studies of Luminescent Silicon Carbonitride Thin Films. ECS Transactions 50(41) , 49-56. 10.1149/05041.0049ecst. SGM, VLS-PGM Materials
Wilson, Patrick R.; Khatami, Zahra; Dabkowski, Ryszard; Dunn, Kayne; Chelomentsev, Evgueni et al. (2012). XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films. ECS Transactions 45(5) , 43-48. 10.1149/1.3700408. SGM, VLS-PGM Materials
Cao, Chuntian; Toney, Michael F.; Sham, Tsun-Kong; Harder, Ross; Shearing, Paul R. et al. (2020). Emerging X-ray imaging technologies for energy materials. Materials Today 34, 132-147. 10.1016/j.mattod.2019.08.011. SGM, SXRMB, VLS-PGM Materials
Ho, J.; Becker, J.; Leedahl, B.; Boukhvalov, D. W.; Zhidkov, I. S. et al. (2019). Electronic structure and structural defects in 3d-metal doped In2O3. Journal of Materials Science: Materials in Electronics 30(15) , 14091-14098. 10.1007/s10854-019-01775-2. REIXS, SGM Materials