Publication Beamlines Strategic Pillar
Achenbach, Sven; Wells, Garth; Jacobs, Michael; Moazed, Banafsheh; Iyer, Swathi et al. (2018). Polymer-based X-ray masks patterned by direct laser writing. Review of Scientific Instruments 89(11) , 115001. 10.1063/1.5041916. SYLMAND Materials
Morhart, Tyler A.; Read, Stuart; Wells, Garth; Jacobs, Michael; Rosendahl, Scott M. et al. (2018). Attenuated Total Reflection Fourier Transform Infrared (ATR FT-IR) Spectromicroscopy Using Synchrotron Radiation and Micromachined Silicon Wafers for Microfluidic Applications. Applied Spectroscopy 72(12) , 000370281878564. 10.1177/0003702818785640. MID-IR, SYLMAND Materials
Brian E. Bewer (2010). Development of an X-ray prism for a combined diffraction enhanced imaging and fluorescence imaging system. Supervisor: Chapman, Dean. Saskatchewan, Canada: University of Saskatchewan. https://ecommons.usask.ca/handle/10388/etd-10212010-105154. BMIT-BM, SYLMAND Materials
Berkenbrock, José-Alvim; Machado, Rafaela Grecco; Achenbach, Sven (2018). How Might X-Ray Scanned Potatoes Improve Cancer Treatment?. Microscopy and Microanalysis 24(S2) , 410-411. 10.1017/s1431927618014332. SYLMAND Materials
Chen Shen (2016). Fabrication and Thermal Analysis of Polyimide-based X-ray Masks. Supervisor: S. Achenbach. Saskatoon, Canada: University of Saskatchewan. http://hdl.handle.net/10388/7474. SYLMAND Materials
Schaffer, Melissa Dawn (2011). High aspect ratio microstructure coupler. Supervisor: Klymyshyn, David. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/etd-02232011-211654. SYLMAND Materials
Iyer, Ganjigunte R. S.; Wang, Jian; Wells, Garth; Bradley, Michael P.; Borondics, Ferenc et al. (2015). Nanoscale imaging of freestanding nitrogen doped single layer graphene. Nanoscale 7(6) , 2289-2294. 10.1039/c4nr05385k. SM, SYLMAND Materials
Iyer, Ganjigunte R. Swathi; Wang, Jian; Wells, Garth; Guruvenket, Srinivasan; Payne, Scott et al. (2014). Large-Area, Freestanding, Single-Layer Graphene–Gold: A Hybrid Plasmonic Nanostructure. ACS Nano 8(6) , 6353-6362. 10.1021/nn501864h. MID-IR, SM, SYLMAND Materials