Publication Beamlines Strategic Pillar
Hitchcock, A. P.; Wu, J.; Lee, V.; Appathurai, N.; Tyliszczak, T. et al. (2016). Progress in Soft X-ray Microscopy Characterization of PEM Fuel Cell Catalyst Layers. Microscopy and Microanalysis 22(S3) , 1290-1291. 10.1017/s1431927616007297. SM Materials
Geilhufe, J.; Leontowich, A. F. G.; Wang, J.; Berg, R.; Regier, C. N. et al. (2018). Soft X-ray Spectrotomographic Microscopy at Cryogenic Temperatures. Microscopy and Microanalysis 24(S2) , 260-261. 10.1017/s1431927618013648. SM Materials
G. A. Melo, Lis; Hitchcock, Adam P; Jankovic, Jasna; Stumper, Jürgen; Susac, Darija et al. (2017). Quantitative Mapping of Ionomer in Catalyst Layers by Electron and X-ray Spectromicroscopy. ECS Transactions 80(8) , 275-282. 10.1149/08008.0275ecst. SM Materials
de A. Melo, Lis G.; Botton, G.A.; Hitchcock, Adam P. (2015). Quantification of the critical dose for radiation damage to perfluorosulfonic acid membranes using soft X-ray microscopy. Microscopy and Microanalysis 21(S3) , 2443-2444. 10.1017/s1431927615012994. SM Materials
Berejnov, Viatcheslav; Saha, Madhu; Susac, Darija; Stumper, Juergen; West, Marcia et al. (2017). Advances in Structural Characterization Using Soft X-ray Scanning Transmission Microscopy (STXM): Mapping and Measuring Porosity in PEM-FC Catalyst Layers. ECS Transactions 80(8) , 241-252. 10.1149/08008.0241ecst. SM Materials