Publication Beamlines Strategic Pillar
Tolhurst; Thomas (2017). Soft X-ray Spectroscopy of Metal Nitrides and Oxides: Uncovering Structure-property Relationships in Phosphors for pc-LEDs. Supervisor: Moewes, Alexander. Saskatchewan, Canada: University of Saskatchewan. http://hdl.handle.net/10388/7916. REIXS, SGM Materials
Horrocks, Gregory A.; De Jesus, Luis R.; Andrews, Justin L.; Banerjee, Sarbajit (2017). X-ray Spectroscopy and Imaging as Multiscale Probes of Intercalation Phenomena in Cathode Materials. JOM 69(9) , 1469-1477. 10.1007/s11837-017-2398-3. REIXS, SM Materials